SLVK199A August   2025  – August 2026 TPS7H3024-SP , TPS7H3034-SP , TPS7H3134-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 LETEFF and Range Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References
  15.   B Revision History

8 Single-Event Transients (SET)

The primary focus of SETs were heavy-ion-induced transient upsets on RESET1, PWRGD, or WDO. SET testing was done at room temperature using 165Ho which produced a LETEFF of 75MeV·cm2/mg. The output signals were monitored by four NI PXIe-5172. The PXIe-5172 was triggered with an edge-negative at –20% below the high voltage when in the on state. During the testing when the device was in the off state, the trigger was set to 0.66V with an edge-positive trigger.

The PXIe-5172 sample rate was set to 100MS/s with a record length of 100k points (or samples). The device was configured with an external voltage that was set to provide an overdrive voltage of ±20mV (typically). The device was tested under the following conditions.

  1. Disabled (SR_UVLO = 0V) with –20mV.
  2. Enabled (SR_UVLO = 1V) with +20mV.

The device was tested under a typical voltage for IN (3.3V) and PULL_UPx (1.8V). Under these configurations not a single transient was recorded on all signals. This demonstrates the TPS7H3XX4-SP is SET and SEFI-free. The SET test conditions and results for eight units are shown in Table 8-5.

Table 8-1 Summary of TPS7H3XX4-SP SET Test Condition and Results
RUN #UNIT #

FACILITY

IONLETEFF (MeV·cm2/mg)FLUX (ions/(cm2·s))

FLUENCE

(ions/cm2)

WD_IN (Hz)

On/Off

PXIe-5172 RESET

1(# OF TRANSIENTS)		PXIe-5172 RESET4(# OF TRANSIENTS)

PXIe-5172 WDO

(# OF TRANSIENTS)

PXIe-5172 PWRGD

(# OF TRANSIENTS)

37

5

TAMU

165Ho

75

9.53 × 1041.00 × 107

100k

On

0

0

0

0

38

5

TAMU

165Ho

75

9.25 × 104

1.00 × 107

0

On

0

0

0

0

39

5

TAMU

165Ho

75

8.96 × 1041.00 × 107

100k

Off

0

0

0

0

40

6

TAMU

165Ho

75

8.00 × 1041.00 × 107

100k

On

0

0

0

0

41

6

TAMU

165Ho

75

8.00 × 104

1.00 × 107

0

On

0

0

0

0

42

6

TAMU

165Ho75

8.50 × 104

1.00 × 107

100k

Off

0

0

0

0

43

7

KSEE

169Tm

75.1

1.12 × 1051.00 × 107

0

On

0

-

0

0

44

8

KSEE169Tm75.11.10 × 1051.00 × 107100kOn

0

-

0

0

45

9

KSEE169Tm75.11.21 × 1051.00 × 107

0

On

0

-

0

0

46

10

KSEE169Tm75.11.10 × 1051.00 × 107100kOn

0

-

0

0

47

11

KSEE169Tm75.11.08 × 1051.00 × 107

0

On

0

-

0

0

48

12

KSEE169Tm75.11.17 × 1051.00 × 107100kOn

0

-

0

0