SLVK298 September   2026 TXGS441-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Test Setup and Procedures
  9. 6 Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-up (SEL) Results
  10. 7 Single-Event Transients (SET) Results
  11. 8 Event Rate Calculations
  12. 9 Summary
  13. 10References

Trademarks

LabVIEW™ is a trademark of National Instruments Corporation.

All trademarks are the property of their respective owners.