SLVSJO3 August   2025 SN74AHC540-Q1

PRODUCTION DATA  

  1.   1
  2. Features
  3.   3
  4. Applications
  5. Description
  6. Pin Configuration and Functions
  7. Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Switching Characteristics
    7. 5.7 Noise Characteristics
    8. 5.8 Typical Characteristics
  8. Parameter Measurement Information
  9. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Balanced CMOS 3-State Outputs
      2. 7.3.2 Standard CMOS Inputs
      3. 7.3.3 Wettable Flanks
      4. 7.3.4 Clamp Diode Structure
    4. 7.4 Device Functional Modes
  10. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Typical Application
        1. 8.1.1.1 Design Requirements
          1. 8.1.1.1.1 Power Considerations
          2. 8.1.1.1.2 Input Considerations
          3. 8.1.1.1.3 Output Considerations
        2. 8.1.1.2 Detailed Design Procedure
        3. 8.1.1.3 Application Curves
    2. 8.2 Power Supply Recommendations
    3. 8.3 Layout
      1. 8.3.1 Layout Guidelines
      2. 8.3.2 Layout Example
  11. Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  12. 10Revision History
  13. 11Mechanical, Packaging, and Orderable Information

Features

  • AEC-Q100 qualified for automotive applications:
    • Device temperature grade 1: -40°C to +125°C
    • Device HBM ESD classification level 2
    • Device CDM ESD classification level C4B
  • Available in wettable flank QFN package
  • Operating range 2V to 5.5V VCC
  • Low delay, 7.3ns max
  • Latch-up performance exceeds 250mA
    per JESD 17