SLVUC35A May   2021  – August 2021

 

  1.   Trademarks
  2. 1Introduction
    1. 1.1 EVM Features
    2. 1.2 EVM Applications
  3. 2Description
  4. 3Schematic
  5. 4General Configurations
    1. 4.1 Physical Access
    2. 4.2 Test Equipment and Set up
      1. 4.2.1 POWER SUPPLIES
      2. 4.2.2 METERS
      3. 4.2.3 OSCILLOSCOPE
      4. 4.2.4 LOADS
  6. 5Test Setup and Procedures
    1. 5.1 Hot Plug Test
    2. 5.2 Startup With a Combination of Capacitive and Resistive Loads
    3. 5.3 Power-Up into Short Test
    4. 5.4 Overvoltage Lockout Test
    5. 5.5 Transient Overload Performance
    6. 5.6 Overcurrent Test
    7. 5.7 Output Hot Short Test
    8. 5.8 USB On-The-Go (OTG) Performance
  7. 6EVAL Board Assembly Drawings and Layout Guidelines
    1. 6.1 PCB Drawings
  8. 7Bill Of Materials (BOM)
  9. 8Revision History

5.1 Hot Plug Test

Use the following instructions to measure the inrush current during hot plug event:

  1. Set Jumper J4 position to desired slew rate as mentioned in Table 4-3.
  2. Set the input supply voltage VIN to 12 V and current limit of 10 A. Enable the power supply.
  3. Hot plug the supply between VIN and PGND points of connector J1.
  4. Observe the waveforms at VOUT (TP2) and input current with an oscilloscope to measure the slew rate and rise time of the eFuse with a given input voltage of 12 V.

Figure 5-2 and Figure 5-3 show the examples of inrush current captured on the TPS25946EVM eFuse Evaluation Board during hot plug event using TPS259460x and TPS259461x variants respectively.

GUID-20210424-CA0I-0LSQ-NRRK-FQ9Q1PJGTKFV-low.gifFigure 5-2 TPS259460x Hot Plug Profile (VIN = 12 V, Cout = 220 µF, CdVdt = 3300 pF, No Load)
GUID-20210721-CA0I-FWHH-TPWZ-HW3TGNRJTXLW-low.gif Figure 5-3 TPS259461x Hot Plug Profile (VIN = 12 V, Cout = 220 µF, CdVdt = 10 nF, No Load)