SNIK003 August   2022 TMP9R00-SP

 

  1.   Abstract
  2.   Trademarks
  3. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  4. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
    4. 2.4 Test Configuration and Condition
  5. 3Tested Parameters
  6. 4Total Ionizing Dose Characterization Test Results
    1. 4.1 Total Ionizing Dose Characterization Summary Results
  7. 5References
  8.   A TID Reports

2.4 Test Configuration and Condition

HDR devices were stressed at 3 krad(Si), 10 krad(Si), 30 krad(Si), 50 krad(Si), 75 krad(Si), 100 krad(Si). LDR devices were stressed at 30 krad(Si), 75 krad(Si), and 100 krad(Si) for biased and unbiased conditions.

Figure 2-1 Bias Diagram Used in TID Exposure
Table 2-1 HDR ≤ 50–100 rad(Si)/s Biased Device Information (HDR)
Exposure Levels
Total sample size : 54
3 krad(Si) 10 krad(Si) 30 krad(Si) 50 krad(Si)
1, 2, 3, 4, 5 1, 2, 3, 4, 5 1, 2, 3, 4, 5 1, 2, 3, 4, 5
Exposure Levels
75 krad(Si) 100 krad(Si)
1, 2, 3, 4, 5 11–32, 33–54
Table 2-2 LDR = 60 mrad(Si)/s Biased Exposure Information (LDR)
Total Sample Size: 16
Exposure Levels
50 krad(Si) 75 krad(Si) 100 krad(Si)
25a–30a 32a–37a 41a–44a