See more about this use case in this video: High-Speed Comparators in Test and Measurement.
Design Challenges
- Input signals can be bipolar in nature (contains
both positive and negative voltages) and often requires level shifting by the
LNA.
- For high-speed waveform capturing, oscilloscopes
need to be able to trigger on very narrow pulse widths while maintaining timing
accuracy.
- A logic analyzer's speed rating depends on how
fast a signal can be detected at the equipment's inputs.
- When high-speed signals need to span large trace
lengths or cables, signal restoration is required to maintain signal
integrity.
How
High-Speed Comparators Benefit the Systems
- A comparator's ability to operate
from split supplies eliminates the need to level shift input signals, greatly
simplifying the input signal path.
- High-speed comparator's narrow
pulse width detection capability with minimum overdrive dispersion
enables the capture of events that occur for short periods of time of varying
amplitudes with high accuracy.
- Comparators with high-speed front
ends and LVDS output stages are well-equipped to capture fast-toggling clocks
and data lines.
- Input hysteresis and variable
input thresholds allow high-speed comparators to restore signal integrity in the
presence of noise and decreased signal strength.
| Part
Number |
Output
Type |
Min Pulse
Width |
Overdrive
Dispersion |
Toggle
Frequency |
Supply
Range |
| TLV3801 and TLV3811 |
LVDS |
240ps |
5ps |
3GHz |
2.7 to
5.25V |
| TLV3604 and TLV3605 |
LVDS |
600ps |
350ps |
1.5GHz |
2.4 to
5.5V |
| TLV3601 and TLV3603 |
Push-pull |
1.25ns |
600ps |
325MHz |
2.4 to
5.5V |
| TLV3901
(Preliminary) |
CML |
80ps |
5ps |
10GHz |
3.1 to
5.25V |
If you have more questions please ask them on TI's
E2E forum.