SWRS223D February   2020  – February 2024 AWR2243

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Functional Block Diagram
  6. 5 Device Comparison
    1. 5.1 Related Products
  7. 6 Terminal Configuration and Functions
    1. 6.1 Pin Diagram
    2. 6.2 Signal Descriptions
  8. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Power-On Hours (POH)
    4. 7.4 Recommended Operating Conditions
    5. 7.5 Power Supply Specifications
    6. 7.6 Power Consumption Summary
    7. 7.7 RF Specification
    8. 7.8 Thermal Resistance Characteristics for FCBGA Package [ABL0161]
    9. 7.9 Timing and Switching Characteristics
      1. 7.9.1 Power Supply Sequencing and Reset Timing
      2. 7.9.2 Synchronized Frame Triggering
      3. 7.9.3 Input Clocks and Oscillators
        1. 7.9.3.1 Clock Specifications
      4. 7.9.4 Multibuffered / Standard Serial Peripheral Interface (MibSPI)
        1. 7.9.4.1 Peripheral Description
          1. 7.9.4.1.1 SPI Timing Conditions
          2. 7.9.4.1.2 SPI Peripheral Mode Switching Parameters (SPICLK = input, SPISIMO = input, and SPISOMI = output)
          3. 7.9.4.1.3 SPI Peripheral Mode Timing Requirements (SPICLK = input, SPISIMO = input, and SPISOMI = output)
        2. 7.9.4.2 Typical Interface Protocol Diagram (Peripheral Mode)
      5. 7.9.5 Inter-Integrated Circuit Interface (I2C)
        1. 7.9.5.1 I2C Timing Requirements
      6. 7.9.6 LVDS Interface Configuration
        1. 7.9.6.1 LVDS Interface Timings
      7. 7.9.7 General-Purpose Input/Output
        1. 7.9.7.1 Switching Characteristics for Output Timing versus Load Capacitance (CL)
      8. 7.9.8 Camera Serial Interface (CSI)
        1. 7.9.8.1 CSI Switching Characteristics
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Subsystems
      1. 8.3.1 RF and Analog Subsystem
        1. 8.3.1.1 Clock Subsystem
        2. 8.3.1.2 Transmit Subsystem
        3. 8.3.1.3 Receive Subsystem
      2. 8.3.2 Host Interface
    4. 8.4 Other Subsystems
      1. 8.4.1 ADC Data Format Over CSI2 Interface
      2. 8.4.2 ADC Channels (Service) for User Application
        1. 8.4.2.1 GPADC Parameters
  10. 9 Monitoring and Diagnostic Mechanisms
  11. 10Applications, Implementation, and Layout
    1. 10.1 Application Information
    2. 10.2 Short-, Medium-, and Long-Range Radar
    3. 10.3 Imaging Radar using Cascade Configuration
    4. 10.4 Reference Schematic
  12. 11Device and Documentation Support
    1. 11.1 Device Nomenclature
    2. 11.2 Tools and Software
    3. 11.3 Documentation Support
    4. 11.4 Support Resources
    5. 11.5 Trademarks
    6. 11.6 Electrostatic Discharge Caution
    7. 11.7 Export Control Notice
    8. 11.8 Glossary
  13. 12Revision History
  14. 13Mechanical, Packaging, and Orderable Information
    1. 13.1 Packaging Information

11.6 Electrostatic Discharge Caution

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.