TIDUFJ9 July   2026

 

  1.   1
  2.   Description
  3.   Resources
  4.   Features
  5.   Applications
  6.   6
  7. 1System Description
    1. 1.1 Key System Specifications
  8. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 DC/DC Boost Converter
      1. 2.2.1 Boost Inductor Design
      2. 2.2.2 Rectifier Diode Selection
      3. 2.2.3 Boost Cooling Concept
      4. 2.2.4 MPPT Operation
    3. 2.3 DC/AC Converter
      1. 2.3.1 Inverter Inductor Design
      2. 2.3.2 DC-Link Capacitor
      3. 2.3.3 Cx Capacitance Selection
      4. 2.3.4 Cy Capacitance Selection
    4. 2.4 Highlighted Products
      1. 2.4.1 LMG366xR025 650V 25mΩ GaN FET With Integrated Driver and Protection
      2. 2.4.2 TMS320F28P551 Real-Time Microcontrollers
        1. 2.4.2.1 Hardware Features
        2. 2.4.2.2 Software Features
      3. 2.4.3 TMCS1123 - Precision 250kHz Hall-Effect Current Sensor With Reinforced Isolation
      4. 2.4.4 INA185 26V, 350kHz, Bidirectional, High-Precision Current Sense Amplifier in Ultra Small (SOT-563) Package
  9. 3Hardware, Software, Testing Requirements, and Test Results
    1. 3.1 Hardware Requirements
    2. 3.2 Test Setup
      1. 3.2.1 Testing TIDA-011008
    3. 3.3 Test Results
      1. 3.3.1 Testing TIDA-011008 Boost Stage
      2. 3.3.2 Testing TIDA-011008 DC/AC Stage
      3. 3.3.3 Total System Testing
  10. 4Design and Documentation Support
    1. 4.1 Design Files
      1. 4.1.1 Schematics
      2. 4.1.2 BOM
    2. 4.2 Tools and Software
    3. 4.3 Documentation Support
    4. 4.4 Support Resources
    5.     Trademarks
  11. 5About the Author

Testing TIDA-011008 Boost Stage

To run this test, the board needs to be connected as shown in 3.2.1.

In this test, the boost stage is tested with the common mode choke shorted, and one of the DC link capacitor is removed for the DC Load connection as shown in Figure 3-1, the testing results are shown below.

TIDA-011008 Connections for testing Boost
                    Stage Figure 3-1 Connections for testing Boost Stage

The switching node waveform as shown in Figure 3-2 has no big overshoot or ringing even with >40V/ns Vds slew rate, indicating the GaN power stage has a clean power loop and good integrated driver circuit.

TIDA-011008 Boost Switching Node
                    Waveform Figure 3-2 Boost Switching Node Waveform

As can be seen in Figure 3-3, the high load maximum efficiency is ~99.2%, the full load efficiency is ~99.1%.

TIDA-011008 Boost Stage Efficiency with
                    Different Input Voltage Figure 3-3 Boost Stage Efficiency with Different Input Voltage

Can be noticed on the low load condition, there are several high efficiency points where the current on the boost inductor goes to 0 and boost is in DCM mode. In this condition, the turning-on voltage on the GaN device is quite low, which achieve almost ZVS, improves the efficiency a lot.

TIDA-011008 Boost Stage GaN Temperature
                    Rise Figure 3-4 Boost Stage GaN Temperature Rise

As can be seen in Figure 3-4, the temperature rise of GaN at maximum output power is ~43°C. The temperature is measure on the other side of PCB since the top side of GaN is attached with heatsink. The test condition is input voltage 250VDC, output voltage 400VDC.