SLVAES3C May   2020  – October 2020 TPS61378-Q1

 

  1. 1Overview
  2. 2Functional Safety Failure In Time (FIT) Rates
  3. 3Failure Mode Distribution (FMD)
  4. 4Pin Failure Mode Analysis (Pin FMA)
  5. 5Revision History

1 Overview

This document contains information for TPS61378-Q1, TPS613781-Q1, TPS613782-Q1, TPS613783-Q1, TPS613784-Q1, TPS613785-Q1(VQFN package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

GUID-20200915-CA0I-GW5C-NL0L-FWQZNKJDTP5S-low.gif Figure 1-1 Functional Block Diagram

TPS61378-Q1, TPS613781-Q1, TPS613782-Q1, TPS613783-Q1, TPS613784-Q1, TPS613785-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.