SNVA955A January   2020  – September 2020 LMQ61460 , LMQ61460-Q1 , LMQ62440-Q1


  1. 1Overview
  2. 2Functional Safety Failure In Time (FIT) Rates
  3. 3Failure Mode Distribution (FMD)
  4. 4Pin Failure Mode Analysis (Pin FMA)
  5. 5Revision History


This document contains information for LMQ61460, LMQ61460-Q1, and LMQ62440-Q1 (VQFN-HR package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 and Figure 1-2 show the device functional block diagrams for reference.

GUID-32AA3E61-D5FD-407E-814A-C3BDB6E4D5CA-low.gif Figure 1-1 Functional Block Diagram: LMQ61460, LMQ61460-Q1
GUID-20200904-CA0I-K7VW-L7VM-LLSLNL2ZRKWX-low.gif Figure 1-2 Functional Block Diagram: LMQ62440-Q1
LMQ61460, LMQ61460-Q1, and LMQ62440-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.