1 Features

Dual output split driver with on-the-fly programmable drive strength
- ±15-A and ±5-A drive current outputs
- Digital input pins (GD*) for drive strength adjustment without SPI
- 3 resistor settings R1, R2, or R1||R2
- Integrated 4-A active Miller clamp or optional external drive for Miller clamp transistor
Primary and secondary side active short circuit (ASC) support
Internal and external supply under-voltage and over-voltage protection
Driver die temperature sensing and over temperature protection
Short-circuit protection:
- 75-ns response time to over-current event
- DESAT protection – selections up to 14 V
- Shunt resistor based over-current protection
- Configurable protection threshold values and blanking times
- Programmable soft turnoff (STO) and two-level soft turnoff (2STO) current
Integrated 10-bit ADC
- Power switch temperature, driver die temperature, DESAT pin voltage, VCC2 voltage, phase current, DC Link voltage
- Programmable digital comparators
Advanced VCE/VDS clamping circuit
Functional Safety-Compliant
- Developed for functional safety applications
- Documentation available to aid ISO 26262 system design up to ASIL D
Integrated diagnostics:
- Built in self-test (BIST) for protection comparators
- Gate threshold voltage measurement for power device health monitoring
- INP to transistor gate path integrity
- Internal clock monitoring
- Fault alarm and warning outputs (nFLT*)
- ISO communication data integrity check
SPI based device reconfiguration, verification, supervision, and diagnosis
100 kV/µs CMTI
Safety-related certifications:
- 5-kV_RMS isolation for 1 minute per UL1577 (planned)
- Reinforced isolation 7070-V_PK per DIN VDE 0884-11: 2017-01 (planned)
AEC-Q100 qualified with the following results:
- Device temperature grade 1: -40°C to +125°C ambient operating temperature
- Device HBM ESD classification level 2
- Device CDM ESD classification level C4B