Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
These octal buffers and line drivers are designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters. The ’HC244 are organized as two 4-bit buffers/drivers with separate output-enable (OE)\ inputs. When OE\ is low, the device passes noninverted data from the A inputs to the Y outputs. When OE\ is high, the outputs are in the high-impedance state.
| Type | Title | Date | ||
|---|---|---|---|---|
| * | Radiation & reliability report | SN74HC244QDWREP Reliability Report | 15 Mar 2012 | |
| * | Data sheet | Octal Buffers and Line Drivers With 3-State Outputs datasheet (Rev. A) | 06 Jan 2004 |
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