Información de empaque
| Encapsulado | Pines B3QFN (RVQ) | 42 |
| Rango de temperatura de funcionamiento (℃) -40 to 85 |
| Cant. de paquetes | Transportador 250 | SMALL T&R |
Características para LMZ31710
- Complete integrated power solution
- Small footprint, low-profile design
- Pin compatible with LMZ31707 and LMZ31704
- 10-mm × 10-mm × 4.3-mm package
- Efficiencies up to 95%
- Eco-Mode™ and light load efficiency (LLE)
- Wide-output voltage adjust
0.6 V to 5.5 V, With 1% reference accuracy - Supports parallel operation for higher current
- Optional split power rail allows
input voltage down to 2.95 V - Adjustable switching frequency
(200 kHz to 1.2 MHz) - Synchronizes to an external clock
- Provides 180° out-of-phase clock signal
- Adjustable slow start
- Output voltage sequencing and tracking
- Power-good output
- Programmable undervoltage lockout (UVLO)
- Overcurrent and overtemperature protection
- Prebias output start-up
- Operating temperature range: –40°C to +85°C
- Enhanced thermal performance: 13.3°C/W
- Meets EN55022 Class B emissions
- integrated shielded inductor - Create a custom design using the LMZ31710 with the WEBENCH® Power Designer
Descripción de LMZ31710
The LMZ31710 power module is an easy-to-use integrated power solution that combines a 10-A DC/DC converter with power MOSFETs, a shielded inductor, and passives into a low-profile QFN package. This total power solution allows as few as three external components and eliminates the loop compensation and magnetics part selection process.
The 10 × 10 × 4.3 mm QFN package is easy to solder onto a printed circuit board and allows a compact point-of-load design. The device achieves greater than 95% efficiency and excellent power dissipation capability with a thermal impedance of 13.3°C/W. The LMZ31710 offers the flexibility and the feature set of a discrete point-of-load design and is ideal for powering a wide range of ICs and systems. Advanced packaging technology affords a robust and reliable power solution compatible with standard QFN mounting and testing techniques.