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AM26LS32AMJB ACTIVE

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Rating

Military
RoHS No
REACH Affected
Device Marking 5962-7802003ME, AM26LS32AMJB, A
Lead finish/Ball material SnPb
MSL rating/Peak reflow Level-NC-NC-NC

MTBF/FIT estimates

MTBF/FIT MTBF/FIT supporting data
MTBF FIT Usage temp (°C) Conf level (%) Activation energy (eV) Test temp (°C) Test duration (hours) Sample size Fails Additional comments
1.6x109 0.6 55 60 0.7 125 1000 41301 1 —

Material content

Homogeneous material level Component level
Component Substance CAS Number Amount (mg) Percentage % ppm Percentage % ppm
Base
Not Categorized
Cobalt Oxide
1308-06-1
7.8
0.300000
3000
0.161913
1619
Not Categorized
Other (Ceramic w/out Declarable Substance)
—
91
3.500000
35000
1.888984
18890
Other Inorganic Materials
Aluminum Oxide
1344-28-1
2269.8
87.300000
873000
47.116655
471167
Other Inorganic Materials
Silicon Dioxide
7631-86-9
67.6
2.600000
26000
1.403245
14032
Other Inorganic Materials
Titanium Oxide
13463-67-7
41.6
1.600000
16000
0.863535
8635
Other Nonferrous Metals and Alloys
Chromium Oxide
1308-38-9
36.4
1.400000
14000
0.755594
7556
Other Nonferrous Metals and Alloys
Manganese Dioxide
1313-13-9
85.8
3.300000
33000
1.781042
17810
Sub-total
— —
2600.0
100
1000000
53.970968
539710
Bond Wire
Aluminum and Its Alloys
Aluminum
7429-90-5
0.056938
99.131222
991312
0.001182
12
Copper and Its Alloys
Copper
7440-50-8
0.000001
0.001741
17
0.000000
0
Copper and Its Alloys
Iron
7439-89-6
0.000002
0.003482
35
0.000000
0
Other Inorganic Materials
Silicon
7440-21-3
0.000495
0.861814
8618
0.000010
0
Precious Metals
Silver
7440-22-4
0.000001
0.001741
17
0.000000
0
Sub-total
— —
0.057437
100
1000000
0.001192
12
Die Attach Adhesive
Other Nonferrous Metals and Alloys
Lead Borate Glass
65997-18-4
0.034035
14.999934
149999
0.000707
7
Other Plastics and Rubber
Other Filler
—
0.011345
4.999978
50000
0.000236
2
Precious Metals
Silver
7440-22-4
0.181521
80.000088
800001
0.003768
38
Sub-total
— —
0.226901
100
1000000
0.004710
47
Lead Frame
Aluminum and Its Alloys
Aluminum
7429-90-5
1.22
0.100000
1000
0.025325
253
Copper and Its Alloys
Iron
7439-89-6
700.8778
57.449000
574490
14.548867
145489
Copper and Its Alloys
Phosphorus
7723-14-0
0.305
0.025000
250
0.006331
63
Nickel and Its Alloys
Nickel
7440-02-0
500.2
41.000000
410000
10.383184
103832
Other Inorganic Materials
Silicon
7440-21-3
3.66
0.300000
3000
0.075975
760
Other Inorganic Materials
Sulfur
7704-34-9
0.305
0.025000
250
0.006331
63
Other Nonferrous Metals and Alloys
Chromium
7440-47-3
3.05
0.250000
2500
0.063312
633
Other Nonferrous Metals and Alloys
Cobalt
7440-48-4
0.0122
0.001000
10
0.000253
3
Other Nonferrous Metals and Alloys
Manganese
7439-96-5
9.76
0.800000
8000
0.202599
2026
Other Plastics and Rubber
Carbon
7440-44-0
0.61
0.050000
500
0.012662
127
Sub-total
— —
1220.0000
100
1000000
25.324839
253248
Lead Frame Plating
Other Nonferrous Metals and Alloys
Lead
7439-92-1
4.514
37.000000
370000
0.093702
937
Other Nonferrous Metals and Alloys
Tin
7440-31-5
7.686
63.000000
630000
0.159546
1595
Sub-total
— —
12.200
100
1000000
0.253248
2532
Lid
Not Categorized
Cobalt Oxide
1308-06-1
1.88523
0.300000
3000
0.039134
391
Not Categorized
Other (Ceramic w/out Declarable Substance)
—
21.99435
3.500000
35000
0.456560
4566
Other Inorganic Materials
Aluminum Oxide
1344-28-1
548.60193
87.300000
873000
11.387914
113879
Other Inorganic Materials
Silicon Dioxide
7631-86-9
16.33866
2.600000
26000
0.339159
3392
Other Inorganic Materials
Titanium Oxide
13463-67-7
10.05456
1.600000
16000
0.208713
2087
Other Nonferrous Metals and Alloys
Chromium Oxide
1308-38-9
8.79774
1.400000
14000
0.182624
1826
Other Nonferrous Metals and Alloys
Manganese Dioxide
1313-13-9
20.73753
3.300000
33000
0.430471
4305
Sub-total
— —
628.41000
100
1000000
13.044575
130446
Lid - Seal
Glass Frit
Iron Cobalt Chromite Black Spinel
68186-97-0
1.77035
0.500000
5000
0.036749
367
Glass Frit
Other (Glass w/out Declarable Substance)
NA
15.93315
4.500000
45000
0.330741
3307
Glass Frit
Silicate Acid, Zinc Salt (4:3)
96906-37-5
53.1105
15.000000
150000
1.102471
11025
Glass Frit
Zinc Stannate
12036-37-2
88.5175
25.000000
250000
1.837452
18375
Other Nonferrous Metals and Alloys
Boron Oxide
1303-86-2
17.7035
5.000000
50000
0.367490
3675
Other Nonferrous Metals and Alloys
Lead Monoxide
1317-36-8
177.035
50.000000
500000
3.674904
36749
Sub-total
— —
354.07000
100
1000000
7.349808
73498
Semiconductor Device
Ceramics / Glass
Doped Silicon
7440-21-3
2.440491
100.000000
1000000
0.050660
507
Sub-total
— —
2.440491
100
1000000
0.050660
507
Total
— —
4817.404829
— —
100
1000000

Qualification summary

No results found

Ongoing reliability monitoring

FAB process reliability data
Fab Process Reliability Test Rolling Year (4Q2025 - 3Q2026) Sample Size Cumulative Sample Size Disposition
BIPOLAR Life test 125C, 1000 Hours or Equivalent JEDEC Condition 693 24846 Pass
Assembly process reliability data
Package Family Reliability Test Cumulative Sample Size Disposition
CDIP High temp storage bake 150C, 1000 Hours or Equivalent JEDEC Condition 77 Pass
CDIP Temperature cycle -65/150C, 500 Hours or Equivalent JEDEC Condition 461 Pass
CDIP Unbiased HAST 130C/85% RH, 96 Hours or Equivalent JEDEC Condition 77 Pass

Additional resources

General quality guidelines

Certifications

Conflict minerals specialized disclosure report

For additional information, please contact TI customer support center.

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Data-type definitions

RoHS

TI products are designated as “RoHS Compliant” when designated RoHS = Yes, or RoHS = Exempt, to comply with EU Directive 2011/65/EU (entered July 21, 2011) and the amended Directive (EU) 2015/863 (effective July 22, 2019) for Restriction of the Use of Hazardous Substances (“RoHS”).

To the best of TI’s knowledge, TI products that are declared as RoHS Compliant

• Do not contain restricted substances above the RoHS maximum allowed threshold values,

OR

• Where applicable, may be subject to one of the RoHS Annex III exemptions for lead (Pb), as documented in "TI RoHS Statement" for more details.

REACH

Yes: Fully compliant to the European Union (EU) RoHS, no exemption required.

Affected: Only used for Regulation for Registration, Evaluation, Authorization and Restriction of Chemicals (REACH) substance of very high concern (SVHC) substances when contained above the threshold. REACH SVHCs are not restricted from use, but if contained above the threshold, further information must be available.

No: Not compliant to EU RoHS.

Please see the "TI REACH Statement" for more details.

Device Marking

Package top marking

Lead finish/Ball material

Lead finish and solder-ball composition

MSL rating/Peak reflow

Moisture sensitivity level (MSL) is a Joint Electron Device Engineering Council (JEDEC) industry standard classification that defines the length of time products can be safely exposed to an ambient environment before high-temperature reflow soldering.

MTBF/FIT estimates

The purpose of this qualification testing is to determine the life of a product and show conditions under which the rates were derived.

Material content

TI bases its material content information on information provided by third-party suppliers. TI takes reasonably diligent steps to provide any required or available information. TI may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and its suppliers may consider certain information proprietary, and thus may not be able make certain information available for release. The material content information is provided by TI “as is.”

Qualification summary

Quality and reliability are built into TI’s culture, with the goal of providing customers high-quality products. TI develops its semiconductor technologies with a minimum goal of fewer than 50 failures in time (FIT) at 100,000 power-on hours at a 105°C junction temperature. TI builds simulations, accelerated testing and robustness evaluations into its product development process. During the product development process, TI carefully assesses silicon process reliability, package reliability and silicon/package interaction.

Ongoing reliability monitoring

The ORM program involves collecting environmental reliability stress data on representative sets of devices, processes and packages. The results from the ORM program are updated quarterly in this report.