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Quality, reliability & packaging data download

TLE2142CPWR ACTIVE

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Rating

Catalog
RoHS Yes
REACH Yes
Device Marking Q2142
Lead finish/Ball material NiPdAu
MSL rating/Peak reflow Level-1-260C-UNLIM

MTBF/FIT estimates

MTBF/FIT MTBF/FIT supporting data
MTBF FIT Usage temp (°C) Conf level (%) Activation energy (eV) Test temp (°C) Test duration (hours) Sample size Fails Additional comments
1.08x108 9.3 55 60 0.7 125 1000 1262 0 —

Material content

Homogeneous material level Component level
Component Substance CAS Number Amount (mg) Percentage % ppm Percentage % ppm
Bond Wire
Copper and Its Alloys
Copper
7440-50-8
0.051284
99.998050
999981
0.087943
879
Precious Metals
Silver
7440-22-4
0.000001
0.001950
19
0.000002
0
Sub-total
— —
0.051285
100
1000000
0.087945
879
Die Attach Adhesive
Precious Metals
Silver
7440-22-4
0.706063
79.999977
800000
1.210777
12108
Thermoplastics
Epoxy
85954-11-6
0.176516
20.000023
200000
0.302695
3027
Sub-total
— —
0.882579
100
1000000
1.513471
15135
Lead Frame
Copper and Its Alloys
Copper
7440-50-8
21.91725
97.410000
974100
37.584319
375843
Copper and Its Alloys
Iron
7439-89-6
0.54
2.400000
24000
0.926007
9260
Copper and Its Alloys
Phosphorus
7723-14-0
0.00675
0.030000
300
0.011575
116
Other Nonferrous Metals and Alloys
Lead
7439-92-1
0.00675
0.030000
300
0.011575
116
Other Nonferrous Metals and Alloys
Tin
7440-31-5
0.00675
0.030000
300
0.011575
116
Zinc and Its Alloys
Zinc
7440-66-6
0.0225
0.100000
1000
0.038584
386
Sub-total
— —
22.50000
100
1000000
38.583635
385836
Lead Frame Plating
Nickel and Its Alloys
Nickel
7440-02-0
0.342432
95.120000
951200
0.587212
5872
Precious Metals
Gold
7440-57-5
0.002808
0.780000
7800
0.004815
48
Precious Metals
Palladium
7440-05-3
0.01476
4.100000
41000
0.025311
253
Sub-total
— —
0.360000
100
1000000
0.617338
6173
Mold Compound
Other Inorganic Materials
Fused Silica
60676-86-0
27.203916
86.000001
860000
46.650043
466500
Other Organic Materials
Carbon Black
1333-86-4
0.094897
0.299999
3000
0.162732
1627
Thermoplastics
Epoxy
85954-11-6
4.333647
13.700000
137000
7.431460
74315
Sub-total
— —
31.632460
100
1000000
54.244235
542442
Semiconductor Device
Ceramics / Glass
Doped Silicon
7440-21-3
2.888555
100.000000
1000000
4.953376
49534
Sub-total
— —
2.888555
100
1000000
4.953376
49534
Total
— —
58.314879
— —
100
1000000

Qualification summary

Stress Reference Min lot qty SS / lot Condition Duration Result Notes
HTOL JESD22-A108 3 77 Life test, 125C 1000 hours Pass Or equivalent JEDEC condition
HTSL JESD22-A103 3 25 High temp storage bake, 150C 1000 hours Pass Or equivalent JEDEC condition
AC/UHAST JESD22-A102/JESD22-A118 3 25 Unbiased HAST 130C / 85% RH 96 hours Pass Or equivalent JEDEC condition
THB/HAST JESD22-A101/JESD22-A110 3 25 HAST 130C/85%RH 96 hours Pass Or equivalent JEDEC condition
TC JESD22-A104 3 25 Temperature cycle -65/150C 500 cycles Pass Or equivalent JEDEC condition
SD J-STD-002 3 22 Per specification >95% lead coverage Pass —
HBM JS-001 1 3 ESD - HBM Classification See data sheet —
CDM JS-002 1 3 ESD - CDM Classification See data sheet —
LU JESD78 1 3 Latch-up Per JESD78 Pass As applicable per JESD78
MSL J-STD-020 — — Per J-STD-020 Classification See data sheet —

Ongoing reliability monitoring

FAB process reliability data
Fab Process Reliability Test Rolling Year (3Q2025 - 2Q2026) Sample Size Cumulative Sample Size Disposition
BIPOLAR Life test 125C, 1000 Hours or Equivalent JEDEC Condition 770 24846 Pass
Assembly process reliability data
Package Family Reliability Test Rolling Year (3Q2025 - 2Q2026) Sample Size Cumulative Sample Size Disposition
TSSOP Biased HAST 130C/85%RH, 96 Hours or Equivalent JEDEC Condition 2541 48571 Pass
TSSOP High temp storage bake 150C, 1000 Hours or Equivalent JEDEC Condition 2277 38315 Pass
TSSOP Temperature cycle -65/150C, 500 Hours or Equivalent JEDEC Condition 6083 105076 Pass
TSSOP Unbiased HAST 130C/85% RH, 96 Hours or Equivalent JEDEC Condition 4697 85185 Pass

Additional resources

General quality guidelines

Certifications

Conflict minerals specialized disclosure report

For additional information, please contact TI customer support center.

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Data-type definitions

RoHS

TI products are designated as “RoHS Compliant” when designated RoHS = Yes, or RoHS = Exempt, to comply with EU Directive 2011/65/EU (entered July 21, 2011) and the amended Directive (EU) 2015/863 (effective July 22, 2019) for Restriction of the Use of Hazardous Substances (“RoHS”).

To the best of TI’s knowledge, TI products that are declared as RoHS Compliant

• Do not contain restricted substances above the RoHS maximum allowed threshold values,

OR

• Where applicable, may be subject to one of the RoHS Annex III exemptions for lead (Pb), as documented in "TI RoHS Statement" for more details.

REACH

Yes: Fully compliant to the European Union (EU) RoHS, no exemption required.

Affected: Only used for Regulation for Registration, Evaluation, Authorization and Restriction of Chemicals (REACH) substance of very high concern (SVHC) substances when contained above the threshold. REACH SVHCs are not restricted from use, but if contained above the threshold, further information must be available.

No: Not compliant to EU RoHS.

Please see the "TI REACH Statement" for more details.

Device Marking

Package top marking

Lead finish/Ball material

Lead finish and solder-ball composition

MSL rating/Peak reflow

Moisture sensitivity level (MSL) is a Joint Electron Device Engineering Council (JEDEC) industry standard classification that defines the length of time products can be safely exposed to an ambient environment before high-temperature reflow soldering.

MTBF/FIT estimates

The purpose of this qualification testing is to determine the life of a product and show conditions under which the rates were derived.

Material content

TI bases its material content information on information provided by third-party suppliers. TI takes reasonably diligent steps to provide any required or available information. TI may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and its suppliers may consider certain information proprietary, and thus may not be able make certain information available for release. The material content information is provided by TI “as is.”

Qualification summary

Quality and reliability are built into TI’s culture, with the goal of providing customers high-quality products. TI develops its semiconductor technologies with a minimum goal of fewer than 50 failures in time (FIT) at 100,000 power-on hours at a 105°C junction temperature. TI builds simulations, accelerated testing and robustness evaluations into its product development process. During the product development process, TI carefully assesses silicon process reliability, package reliability and silicon/package interaction.

Ongoing reliability monitoring

The ORM program involves collecting environmental reliability stress data on representative sets of devices, processes and packages. The results from the ORM program are updated quarterly in this report.