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Quality, reliability & packaging data download

TMCS1126BFAQDVGR ACTIVE

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Quality data will change based on assembly site

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Rating

Catalog
RoHS Yes
REACH Yes
Device Marking 1126BFA
Lead finish/Ball material Sn
MSL rating/Peak reflow Level-2-260C-1 YEAR

MTBF/FIT estimates

MTBF/FIT MTBF/FIT supporting data
MTBF FIT Usage temp (°C) Conf level (%) Activation energy (eV) Test temp (°C) Test duration (hours) Sample size Fails Additional comments
5.97x108 1.7 55 60 0.7 125 1000 6973 0 —

Material content

Homogeneous material level Component level
Component Substance CAS Number Amount (mg) Percentage % ppm Percentage % ppm
Bond Wire
Other Nonferrous Metals and Alloys
Yttrium
7440-65-5
0.000001
0.000785
8
0.000000
0
Precious Metals
Gold
7440-57-5
0.127443
99.998431
999984
0.025233
252
Precious Metals
Silver
7440-22-4
0.000001
0.000785
8
0.000000
0
Sub-total
— —
0.127445
100
1000000
0.025233
252
Die Attach Adhesive
Other Inorganic Materials
Silica
7631-86-9
0.151057
50.999862
509999
0.029909
299
Thermoplastics
Epoxy
85954-11-6
0.145134
49.000138
490001
0.028736
287
Sub-total
— —
0.296191
100
1000000
0.058644
586
Lead Frame
Copper and Its Alloys
Copper
7440-50-8
170.69298
97.427500
974275
33.796340
337963
Copper and Its Alloys
Iron
7439-89-6
4.1172
2.350000
23500
0.815185
8152
Copper and Its Alloys
Phosphorus
7723-14-0
0.14454
0.082500
825
0.028618
286
Other Nonferrous Metals and Alloys
Lead
7439-92-1
0.02628
0.015000
150
0.005203
52
Zinc and Its Alloys
Zinc
7440-66-6
0.219
0.125000
1250
0.043361
434
Sub-total
— —
175.20000
100
1000000
34.688707
346887
Lead Frame Plating
Other Nonferrous Metals and Alloys
Tin
7440-31-5
2.434
100.000000
1000000
0.481920
4819
Sub-total
— —
2.434
100
1000000
0.481920
4819
Mold Compound
Other Inorganic Materials
Fused Silica
60676-86-0
290.730897
89.500000
895000
57.563236
575632
Other Organic Materials
Carbon Black
1333-86-4
1.624195
0.500000
5000
0.321582
3216
Other Organic Materials
Chlorine
7782-50-5
0.006497
0.002000
20
0.001286
13
Thermoplastics
Epoxy
85954-11-6
32.477402
9.998000
99980
6.430360
64304
Sub-total
— —
324.838991
100
1000000
64.316465
643165
Semiconductor Device
Ceramics / Glass
Doped Silicon
7440-21-3
2.166874
100.000000
1000000
0.429030
4290
Sub-total
— —
2.166874
100
1000000
0.429030
4290
Total
— —
505.063501
— —
100
1000000

Qualification summary

Stress Reference Min lot qty SS / lot Condition Duration Result Notes
HTOL JESD22-A108 3 77 Life test, 125C 1000 hours Pass Or equivalent JEDEC condition
HTSL JESD22-A103 3 25 High temp storage bake, 150C 1000 hours Pass Or equivalent JEDEC condition
AC/UHAST JESD22-A102/JESD22-A118 3 25 Unbiased HAST 130C / 85% RH 96 hours Pass Or equivalent JEDEC condition
THB/HAST JESD22-A101/JESD22-A110 3 25 HAST 130C/85%RH 96 hours Pass Or equivalent JEDEC condition
TC JESD22-A104 3 25 Temperature cycle -65/150C 500 cycles Pass Or equivalent JEDEC condition
SD J-STD-002 3 22 Per specification >95% lead coverage Pass —
HBM JS-001 1 3 ESD - HBM Classification See data sheet —
CDM JS-002 1 3 ESD - CDM Classification See data sheet —
LU JESD78 1 3 Latch-up Per JESD78 Pass As applicable per JESD78
MSL J-STD-020 — — Per J-STD-020 Classification See data sheet —

Ongoing reliability monitoring

FAB process reliability data
Fab Process Reliability Test Rolling Year (4Q2025 - 3Q2026) Sample Size Cumulative Sample Size Disposition
High-Precision CMOS Life test 125C, 1000 Hours or Equivalent JEDEC Condition 2926 64347 Pass
Assembly process reliability data
Package Family Reliability Test Rolling Year (4Q2025 - 3Q2026) Sample Size Cumulative Sample Size Disposition
SOIC Biased HAST 130C/85%RH, 96 Hours or Equivalent JEDEC Condition 5061 85479 Pass
SOIC High temp storage bake 150C, 1000 Hours or Equivalent JEDEC Condition 5627 74925 Pass
SOIC Temperature cycle -65/150C, 500 Hours or Equivalent JEDEC Condition 13223 189952 Pass
SOIC Unbiased HAST 130C/85% RH, 96 Hours or Equivalent JEDEC Condition 7777 139298 Pass

Additional resources

General quality guidelines

Certifications

Conflict minerals specialized disclosure report

For additional information, please contact TI customer support center.

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Data-type definitions

RoHS

TI products are designated as “RoHS Compliant” when designated RoHS = Yes, or RoHS = Exempt, to comply with EU Directive 2011/65/EU (entered July 21, 2011) and the amended Directive (EU) 2015/863 (effective July 22, 2019) for Restriction of the Use of Hazardous Substances (“RoHS”).

To the best of TI’s knowledge, TI products that are declared as RoHS Compliant

• Do not contain restricted substances above the RoHS maximum allowed threshold values,

OR

• Where applicable, may be subject to one of the RoHS Annex III exemptions for lead (Pb), as documented in "TI RoHS Statement" for more details.

REACH

Yes: Fully compliant to the European Union (EU) RoHS, no exemption required.

Affected: Only used for Regulation for Registration, Evaluation, Authorization and Restriction of Chemicals (REACH) substance of very high concern (SVHC) substances when contained above the threshold. REACH SVHCs are not restricted from use, but if contained above the threshold, further information must be available.

No: Not compliant to EU RoHS.

Please see the "TI REACH Statement" for more details.

Device Marking

Package top marking

Lead finish/Ball material

Lead finish and solder-ball composition

MSL rating/Peak reflow

Moisture sensitivity level (MSL) is a Joint Electron Device Engineering Council (JEDEC) industry standard classification that defines the length of time products can be safely exposed to an ambient environment before high-temperature reflow soldering.

MTBF/FIT estimates

The purpose of this qualification testing is to determine the life of a product and show conditions under which the rates were derived.

Material content

TI bases its material content information on information provided by third-party suppliers. TI takes reasonably diligent steps to provide any required or available information. TI may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and its suppliers may consider certain information proprietary, and thus may not be able make certain information available for release. The material content information is provided by TI “as is.”

Qualification summary

Quality and reliability are built into TI’s culture, with the goal of providing customers high-quality products. TI develops its semiconductor technologies with a minimum goal of fewer than 50 failures in time (FIT) at 100,000 power-on hours at a 105°C junction temperature. TI builds simulations, accelerated testing and robustness evaluations into its product development process. During the product development process, TI carefully assesses silicon process reliability, package reliability and silicon/package interaction.

Ongoing reliability monitoring

The ORM program involves collecting environmental reliability stress data on representative sets of devices, processes and packages. The results from the ORM program are updated quarterly in this report.