- IEC61000-4-2 compliance testing
- 4-port s-parameter analysis
- USB 2.0 throughput analysis
- Electrostatic discharge (ESD) clamping waveforms during an ESD event
Texas Instruments TPD2E2U06-Q1EVM
The TPD2E2U06-Q1EVM contains seven TPD2E2U06-Q1’s. A single TPD2E2U06-Q1 (U1) is configured with two USB 2.0 Type A connectors (USB1 & USB2) for capturing system level tests. A single TPD2E2U06-Q1 (U2) is configured with 4 SMA (J1 – J4) connectors to allow 4-port analysis with a vector network analyzer. Five TPD2E2U06-Q1s (U3 – U7) are configured with test points for striking ESD to the protection pins. One TPD2E2U06-Q1 (U6) is configured for capturing clamping waveforms using J8 with an oscilloscope during an ESD test.