TPD2E2U06-Q1EVM

TPD2E2U06-Q1 Dual-Channel High-Speed ESD Protection Evaluation Module

TPD2E2U06-Q1EVM

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Overview

The TPD2E2U06-Q1EVM contains seven TPD2E2U06-Q1’s. A single TPD2E2U06-Q1 (U1) is configured with two USB 2.0 Type A connectors (USB1 & USB2) for capturing system level tests. A single TPD2E2U06-Q1 (U2) is configured with 4 SMA (J1 – J4) connectors to allow 4-port analysis with a vector network analyzer. Five TPD2E2U06-Q1s (U3 – U7) are configured with test points for striking ESD to the protection pins. One TPD2E2U06-Q1 (U6) is configured for capturing clamping waveforms using J8 with an oscilloscope during an ESD test.

Features
  • IEC61000-4-2 compliance testing
  • 4-port s-parameter analysis
  • USB 2.0 throughput analysis
  • Electrostatic discharge (ESD) clamping waveforms during an ESD event
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TPD2E2U06-Q1EVM — TPD2E2U06-Q1 Dual-Channel High-Speed ESD Protection Evaluation Module

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TPD2E2U06-Q1EVM TPD2E2U06-Q1 Dual-Channel High-Speed ESD Protection Evaluation Module

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Technical documentation

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Type Title Date
* EVM User's guide TPD2E2U06QEVM User's Guide Dec 2, 2014
Certificate TPD2E2U06-Q1EVM EU Declaration of Conformity (DoC) Jan 2, 2019

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