Home
Video library

SPI over LVDS for Test & Measurement applications

00:05:06 | 16 JUL 2018
This video presents SPI over LVDS implementation for test & measurement applications. SPI is a common data communication method used between processors and peripheral devices in test & measurement applications. LVDS interface offers high noise immunity, EMI reduction, and the possibility to send SPI signals from PCB to PCB. In this video, we present different options on sending SPI over LVDS, an estimated additional PCB area, and a method on solving the round trip delay issue. 

Resources

  • arrow-right TI LVDS Portfolio
  • arrow-right TI Design TIDA-060017
  • arrow-right LVDS Fundamental Training Series
download

Browse videos

View all videos
View all videos
Products
  • Amplifiers
  • Audio, haptics & piezo
  • Clocks & timing
  • DLP products
  • Data converters
  • Die & wafer services
  • Interface
  • Isolation
  • Logic & voltage translation
  • Microcontrollers (MCUs) & processors
  • Motor drivers
  • Power management
  • RF & microwave
  • Sensors
  • Switches & multiplexers
  • Wireless connectivity
Applications
  • Automotive
  • Communications equipment
  • Data center
  • Industrial
  • Personal electronics