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Battery testing with GaN and C2000

00:01:26 | 20 FEB 2024

The demo shows implementation of precise charge and discharge control using C2000™ real-time MCUs and TI’s latest 100V GaN device. The reference design utilizes high resolution PWM subsystem of C2000 and a 16-bit precision SAR ADC to achieve both current and voltage regulation error better than ±0.02% of full-scale.

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  • download Read the technical article to learn benefits of digital control loop
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