SLUSBU9H March   2014  ā€“ June 2021 BQ2970 , BQ2971 , BQ2972 , BQ2973

PRODUCTION DATA  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Device Comparison Table
  6. Pin Configuration and Functions
    1. 6.1 Pin Descriptions
      1. 6.1.1 Supply Input: BAT
      2. 6.1.2 Cell Negative Connection: VSS
      3. 6.1.3 Voltage Sense Node: Vā€“
      4. 6.1.4 Discharge FET Gate Drive Output: DOUT
      5. 6.1.5 Charge FET Gate Drive Output: COUT
  7. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 DC Characteristics
    6. 7.6 Programmable Fault Detection Thresholds
    7. 7.7 Programmable Fault Detection Timer Ranges
    8. 7.8 Typical Characteristics
  8. Parameter Measurement Information
    1. 8.1 Timing Charts
    2. 8.2 Test Circuits
    3. 8.3 Test Circuit Diagrams
  9. Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
    4. 9.4 Device Functional Modes
      1. 9.4.1 Normal Operation
      2. 9.4.2 Overcharge Status
      3. 9.4.3 Over-Discharge Status
      4. 9.4.4 Discharge Overcurrent Status (Discharge Overcurrent, Load Short-Circuit)
      5. 9.4.5 Charge Overcurrent Status
      6. 9.4.6 0-V Charging Function Enabled
      7. 9.4.7 0-V Charging Inhibit Function
      8. 9.4.8 Delay Circuit
  10. 10Application and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
      3. 10.2.3 Application Performance Plots
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Related Documentation
    2. 13.2 Support Resources
    3. 13.3 Trademarks
    4. 13.4 Electrostatic Discharge Caution
    5. 13.5 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Application Information

The BQ2970 devices are a family of primary protectors used for protection of the battery pack in the application. The application drives two low-side NMOS FETs that are controlled to provide energy to the system loads or interrupt the power in the event of a fault condition.