SLLS040I August   1987  – January 2023 SN65ALS176 , SN75ALS176 , SN75ALS176A , SN75ALS176B

PRODUCTION DATA  

  1. Features
  2. Description
  3. Revision History
  4. Pin Configuration and Functions
  5. Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  Recommended Operating Conditions
    3. 5.3  Thermal Information
    4. 5.4  Electrical Characteristics - Driver
    5. 5.5  Switching Characteristics - Driver
    6. 5.6  Switching Characteristics - Driver
    7. 5.7  Symbol Equivalents
    8. 5.8  Electrical Characteristics - Receiver
    9. 5.9  Switching Characteristics - Receiver
    10. 5.10 Switching Characteristics - Receiver
    11. 5.11 Typical Characteristics
  6. Parameter Measurement Information
  7. Detailed Description
    1. 7.1 Functional Block Diagram
    2. 7.2 Device Functional Modes
  8. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
  9. Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  10. 10Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • D|8
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VCC Supply voltage(2) 7 V
Voltage range at any bus terminal -7 12 V
VI Enable input voltage 5.5 V
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260
Tstg Storage temperature range -65 150
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values, except differential I/O bus voltage, are with respect to network ground terminal.