SBOS934A August   2018  – December 2018 TLV6001-Q1 , TLV6002-Q1

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
    1.     CMRR and PSRR vs Temperature
  4. Revision History
  5. Pin Configuration and Functions
    1.     Pin Functions: TLV6001-Q1
    2.     Pin Functions: TLV6002-Q1
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information: TLV6001-Q1
    5. 6.5 Thermal Information: TLV6002-Q1
    6. 6.6 Electrical Characteristics: VS = 1.8 V to 5 V (±0.9 V to ±2.75 V)
    7. 6.7 Typical Characteristics: Table of Graphs
    8. 6.8 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Operating Voltage
      2. 7.3.2 Rail-to-Rail Input
      3. 7.3.3 Rail-to-Rail Output
      4. 7.3.4 Common-Mode Rejection Ratio (CMRR)
      5. 7.3.5 Capacitive Load and Stability
      6. 7.3.6 EMI Susceptibility and Input Filtering
    4. 7.4 Device Functional Modes
    5. 7.5 Input and ESD Protection
  8. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
    3. 8.3 System Examples
  9. Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example: Single Channel
    3. 10.3 Layout Example: Dual Channel
  11. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Related Links
    3. 11.3 Receiving Notification of Documentation Updates
    4. 11.4 Community Resources
    5. 11.5 Trademarks
    6. 11.6 Electrostatic Discharge Caution
    7. 11.7 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • DCK|5
Thermal pad, mechanical data (Package|Pins)
Orderable Information

EMI Susceptibility and Input Filtering

Operational amplifiers vary with regard to the susceptibility of the device to electromagnetic interference (EMI). If conducted EMI enters the op amp, the dc offset observed at the amplifier output can shift from the nominal value while EMI is present. This shift is a result of signal rectification associated with the internal semiconductor junctions. While all op amp pin functions can be affected by EMI, the signal input pins are likely to be the most susceptible. The TLV600x-Q1 family incorporates an internal input low-pass filter that reduces the amplifiers response to EMI. This filter provides common-mode and differential mode filtering. The filter is designed for a cutoff frequency of approximately 35 MHz (–3 dB) with a rolloff of 20 dB per decade.

Texas Instruments developed the ability to accurately measure and quantify the immunity of an operational amplifier over a broad frequency spectrum extending from 10 MHz to 6 GHz. The EMI rejection ratio (EMIRR) metric allows op amps to be directly compared by the EMI immunity. Figure 18 shows the results of this testing on the TLV600x-Q1 family. EMI Rejection Ratio of Operational Amplifiers shows detailed information, and is available for download from www.ti.com.