SLOS787J May   2012  – March 2020 TRF7964A

PRODUCTION DATA.  

  1. 1Device Overview
    1. 1.1 Features
    2. 1.2 Applications
    3. 1.3 Description
    4. 1.4 Functional Block Diagram
  2. 2Revision History
  3. 3Device Characteristics
    1. 3.1 Related Products
  4. 4Terminal Configuration and Functions
    1. 4.1 Pin Diagram
    2. 4.2 Signal Descriptions
      1. Table 4-1 Terminal Functions
  5. 5Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Electrical Characteristics
    5. 5.5 Thermal Resistance Characteristics
    6. 5.6 Switching Characteristics
  6. 6Detailed Description
    1. 6.1  Overview
      1. 6.1.1 RFID – Reader and Writer
    2. 6.2  System Block Diagram
    3. 6.3  Power Supplies
      1. 6.3.1 Supply Arrangements
      2. 6.3.2 Supply Regulator Settings
      3. 6.3.3 Power Modes
    4. 6.4  Receiver – Analog Section
      1. 6.4.1 Main and Auxiliary Receivers
      2. 6.4.2 Receiver Gain and Filter Stages
    5. 6.5  Receiver – Digital Section
      1. 6.5.1 Received Signal Strength Indicator (RSSI)
        1. 6.5.1.1 Internal RSSI – Main and Auxiliary Receivers
        2. 6.5.1.2 External RSSI
    6. 6.6  Oscillator Section
    7. 6.7  Transmitter – Analog Section
    8. 6.8  Transmitter – Digital Section
    9. 6.9  Transmitter – External Power Amplifier and Subcarrier Detector
    10. 6.10 TRF7964A IC Communication Interface
      1. 6.10.1 General Introduction
        1. 6.10.1.1 Continuous Address Mode
        2. 6.10.1.2 Noncontinuous Address Mode (Single Address Mode)
        3. 6.10.1.3 Direct Command Mode
        4. 6.10.1.4 FIFO Operation
      2. 6.10.2 Parallel Interface Mode
      3. 6.10.3 Reception of Air Interface Data
      4. 6.10.4 Data Transmission From MCU to TRF7964A
      5. 6.10.5 Serial Interface Communication (SPI)
        1. 6.10.5.1 Serial Interface Mode With Slave Select (SS)
      6. 6.10.6 Direct Mode
    11. 6.11 TRF7964A Initialization
    12. 6.12 Special Direct Mode for Improved MIFARE Compatibility
    13. 6.13 Direct Commands from MCU to Reader
      1. 6.13.1 Command Codes
        1. 6.13.1.1  Idle (0x00)
        2. 6.13.1.2  Software Initialization (0x03)
        3. 6.13.1.3  Reset FIFO (0x0F)
        4. 6.13.1.4  Transmission With CRC (0x11)
        5. 6.13.1.5  Transmission Without CRC (0x10)
        6. 6.13.1.6  Delayed Transmission With CRC (0x13)
        7. 6.13.1.7  Delayed Transmission Without CRC (0x12)
        8. 6.13.1.8  Transmit Next Time Slot (0x14)
        9. 6.13.1.9  Block Receiver (0x16)
        10. 6.13.1.10 Enable Receiver (0x17)
        11. 6.13.1.11 Test Internal RF (RSSI at RX Input With TX ON) (0x18)
        12. 6.13.1.12 Test External RF (RSSI at RX Input with TX OFF) (0x19)
    14. 6.14 Register Description
      1. 6.14.1 Register Preset
      2. 6.14.2 Register Overview
      3. 6.14.3 Detailed Register Description
        1. 6.14.3.1 Main Configuration Registers
          1. 6.14.3.1.1 Chip Status Control Register (0x00)
          2. 6.14.3.1.2 ISO Control Register (0x01)
        2. 6.14.3.2 Control Registers – Sublevel Configuration Registers
          1. 6.14.3.2.1  ISO/IEC 14443 TX Options Register (0x02)
          2. 6.14.3.2.2  ISO/IEC 14443 High-Bit-Rate and Parity Options Register (0x03)
          3. 6.14.3.2.3  TX Timer High Byte Control Register (0x04)
          4. 6.14.3.2.4  TX Timer Low Byte Control Register (0x05)
          5. 6.14.3.2.5  TX Pulse Length Control Register (0x06)
          6. 6.14.3.2.6  RX No Response Wait Time Register (0x07)
          7. 6.14.3.2.7  RX Wait Time Register (0x08)
          8. 6.14.3.2.8  Modulator and SYS_CLK Control Register (0x09)
          9. 6.14.3.2.9  RX Special Setting Register (0x0A)
          10. 6.14.3.2.10 Regulator and I/O Control Register (0x0B)
        3. 6.14.3.3 Status Registers
          1. 6.14.3.3.1 IRQ Status Register (0x0C)
          2. 6.14.3.3.2 Interrupt Mask Register (0x0D) and Collision Position Register (0x0E)
          3. 6.14.3.3.3 RSSI Levels and Oscillator Status Register (0x0F)
          4. 6.14.3.3.4 Special Functions Register (0x10)
          5. 6.14.3.3.5 Special Functions Register (0x11)
          6. 6.14.3.3.6 Adjustable FIFO IRQ Levels Register (0x14)
        4. 6.14.3.4 Test Registers
          1. 6.14.3.4.1 Test Register (0x1A)
          2. 6.14.3.4.2 Test Register (0x1B)
        5. 6.14.3.5 FIFO Control Registers
          1. 6.14.3.5.1 FIFO Status Register (0x1C)
          2. 6.14.3.5.2 TX Length Byte1 Register (0x1D), TX Length Byte2 Register (0x1E)
  7. 7Applications, Implementation, and Layout
    1. 7.1 TRF7964A Reader System Using SPI With SS Mode
      1. 7.1.1 General Application Considerations
      2. 7.1.2 Schematic
    2. 7.2 Layout Considerations
    3. 7.3 Impedance Matching TX_Out (Pin 5) to 50 Ω
    4. 7.4 Reader Antenna Design Guidelines
  8. 8Device and Documentation Support
    1. 8.1 Getting Started and Next Steps
    2. 8.2 Device Nomenclature
    3. 8.3 Tools and Software
    4. 8.4 Documentation Support
    5. 8.5 Support Resources
    6. 8.6 Trademarks
    7. 8.7 Electrostatic Discharge Caution
    8. 8.8 Glossary
  9. 9Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Layout Considerations

Keep all decoupling capacitors as close to the IC as possible, with the high-frequency decoupling capacitors (10 nF) closer than the low-frequency decoupling capacitors (2.2 µF).

Place ground vias as close as possible to the ground side of the capacitors and reader IC pins to minimize possible ground loops.

TI recommends not using any inductor sizes smaller than 0603, as the output power can be compromised. If smaller inductors are necessary, output performance must be confirmed in the final application.

Pay close attention to the required load capacitance of the crystal, and adjust the two external shunt capacitors accordingly. Follow the recommendations of the crystal manufacturer for those values.

There should be a common ground plane for the digital and analog sections. The multiple ground sections or islands should have vias that tie the different sections of the planes together.

Ensure that the exposed thermal pad at the center of the reader IC is properly laid out. It should be tied to ground to help dissipate any heat from the package.

All trace line lengths should be made as short as possible, particularly the RF output path, crystal connections, and control lines from the reader to the microprocessor. Proper placement of the TRF7964A, microprocessor, crystal, and RF connection or connector help facilitate this.

Avoid crossing of digital lines under RF signal lines. Also, avoid crossing of digital lines with other digital lines when possible. If the crossings are unavoidable, 90° crossings should be used to minimize coupling of the lines.

Depending on the production test plan, consider possible implementations of test pads or test vias for use during testing. The necessary pads or vias should be placed in accordance with the proposed test plan to enable easy access to those test points.

If the system implementation is complex (for example, if the RFID reader module is a subsystem of a greater system with other modules (microprocessors and clocks), special considerations should be taken to ensure that there is no noise coupling into the supply lines. If needed, special filtering or regulator considerations should be used to minimize or eliminate noise in these systems.

For more information/details on layout considerations, see the TRF796x HF-RFID Reader Layout Design Guide.