7.1 Absolute Maximum Ratings(1)(2)(3)
over operating free-air temperature range (unless otherwise noted)
|
MIN |
MAX |
UNIT |
Supply voltage |
VDD |
–0.3 |
35 |
V |
Continuous |
OUTH, OUTL, OUT |
–0.3 |
VDD + 0.3 |
V |
Pulse |
OUTH, OUTL, OUT (200 ns) |
–2 |
VDD + 0.3 |
V |
Continuous IN, EN, IN+, IN-, IN1, IN2 |
–5 |
27 |
V |
Pulse IN, EN, IN+, IN-, IN1, IN2 (1.5 µs) |
–6.5 |
27 |
V |
Operating virtual junction temperature, TJ |
–40 |
150 |
°C |
Lead temperature |
Soldering, 10 sec. |
|
300 |
°C |
Reflow |
|
260 |
Storage temperature, Tstg |
–65 |
150 |
°C |
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages are with respect to GND unless otherwise noted. Currents are positive into, negative out of the specified terminal. See Packaging Section of the datasheet for thermal limitations and considerations of packages.
(3) These devices are sensitive to electrostatic discharge; follow proper device handling procedures.
7.2 ESD Ratings
|
VALUE |
UNIT |
V(ESD) |
Electrostatic discharge |
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) |
±2000 |
V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) |
±750 |
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.