JAJSRL6 November   2023 AFE432A3W , AFE532A3W

PRODUCTION DATA  

  1.   1
  2. 特長
  3. アプリケーション
  4. 概要
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics: Voltage Output
    6. 5.6  Electrical Characteristics: Current Output
    7. 5.7  Electrical Characteristics: Comparator Mode
    8. 5.8  Electrical Characteristics: ADC Input
    9. 5.9  Electrical Characteristics: General
    10. 5.10 Timing Requirements: I2C Standard Mode
    11. 5.11 Timing Requirements: I2C Fast Mode
    12. 5.12 Timing Requirements: I2C Fast-Mode Plus
    13. 5.13 Timing Requirements: SPI Write Operation
    14. 5.14 Timing Requirements: SPI Read and Daisy Chain Operation (FSDO = 0)
    15. 5.15 Timing Requirements: SPI Read and Daisy Chain Operation (FSDO = 1)
    16. 5.16 Timing Requirements: GPIO
    17. 5.17 Timing Diagrams
    18. 5.18 Typical Characteristics: Voltage Output
    19. 5.19 Typical Characteristics: Current Output
    20. 5.20 Typical Characteristics: Comparator
    21. 5.21 Typical Characteristics: ADC
    22. 5.22 Typical Characteristics: General
  7. Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Smart Analog Front End (AFE) Architecture
      2. 6.3.2 Digital Input/Output
      3. 6.3.3 Nonvolatile Memory (NVM)
    4. 6.4 Device Functional Modes
      1. 6.4.1 Voltage-Output Mode
        1. 6.4.1.1 Voltage Reference and DAC Transfer Function
          1. 6.4.1.1.1 Internal Reference
          2. 6.4.1.1.2 Power-Supply as Reference
      2. 6.4.2 Current-Output Mode
      3. 6.4.3 Comparator Mode
        1. 6.4.3.1 Programmable Hysteresis Comparator
        2. 6.4.3.2 Programmable Window Comparator
      4. 6.4.4 Analog-to-Digital Converter (ADC) Mode
      5. 6.4.5 Fault-Dump Mode
      6. 6.4.6 Application-Specific Modes
        1. 6.4.6.1 Voltage Margining and Scaling
          1. 6.4.6.1.1 High-Impedance Output and PROTECT Input
          2. 6.4.6.1.2 Programmable Slew-Rate Control
        2. 6.4.6.2 Function Generation
          1. 6.4.6.2.1 Triangular Waveform Generation
          2. 6.4.6.2.2 Sawtooth Waveform Generation
          3. 6.4.6.2.3 Sine Waveform Generation
      7. 6.4.7 Device Reset and Fault Management
        1. 6.4.7.1 Power-On Reset (POR)
        2. 6.4.7.2 External Reset
        3. 6.4.7.3 Register-Map Lock
        4. 6.4.7.4 NVM Cyclic Redundancy Check (CRC)
          1. 6.4.7.4.1 NVM-CRC-FAIL-USER Bit
          2. 6.4.7.4.2 NVM-CRC-FAIL-INT Bit
      8. 6.4.8 General-Purpose Input/Output (GPIO) Modes
    5. 6.5 Programming
      1. 6.5.1 SPI Programming Mode
      2. 6.5.2 I2C Programming Mode
        1. 6.5.2.1 F/S Mode Protocol
        2. 6.5.2.2 I2C Update Sequence
          1. 6.5.2.2.1 Address Byte
          2. 6.5.2.2.2 Command Byte
        3. 6.5.2.3 I2C Read Sequence
  8. Register Map
    1. 7.1  NOP Register (address = 00h) [reset = 0000h]
    2. 7.2  DAC-0-MARGIN-HIGH Register (address = 0Dh) [reset = 0000h]
    3. 7.3  DAC-1-MARGIN-HIGH Register (address = 13h) [reset = 0000h]
    4. 7.4  DAC-2-MARGIN-HIGH Register (address = 01h) [reset = 0000h]
    5. 7.5  DAC-0-MARGIN-LOW Register (address = 0Eh) [reset = 0000h]
    6. 7.6  DAC-1-MARGIN-LOW Register (address = 14h) [reset = 0000h]
    7. 7.7  DAC-2-MARGIN-LOW Register (address = 02h) [reset = 0000h]
    8. 7.8  DAC-0-GAIN-CONFIG Register (address = 0Fh) [reset = 0000h]
    9. 7.9  DAC-1-GAIN-CMP-CONFIG Register (address = 15h) [reset = 0000h]
    10. 7.10 DAC-2-GAIN-CONFIG Register (address = 03h) [reset = 0000h]
    11. 7.11 DAC-1-CMP-MODE-CONFIG Register (address = 17h) [reset = 0000h]
    12. 7.12 DAC-0-FUNC-CONFIG Register (address = 12h) [reset = 0000h]
    13. 7.13 DAC-1-FUNC-CONFIG Register (address = 18h) [reset = 0000h]
    14. 7.14 DAC-2-FUNC-CONFIG Register (address = 06h) [reset = 0000h]
    15. 7.15 DAC-0-DATA Register (address = 1Bh) [reset = 0000h]
    16. 7.16 DAC-1-DATA Register (address = 1Ch) [reset = 0000h]
    17. 7.17 DAC-2-DATA Register (address = 19h) [reset = 0000h]
    18. 7.18 ADC-CONFIG-TRIG Register (address = 1Dh) [reset = 0000h]
    19. 7.19 ADC-DATA Register (address = 1Eh) [reset = 0001h]
    20. 7.20 COMMON-CONFIG Register (address = 1Fh) [reset = 0FFFh]
    21. 7.21 COMMON-TRIGGER Register (address = 20h) [reset = 0000h]
    22. 7.22 COMMON-DAC-TRIG Register (address = 21h) [reset = 0000h]
    23. 7.23 GENERAL-STATUS Register (address = 22h) [reset = 20h, DEVICE-ID, VERSION-ID]
    24. 7.24 CMP-STATUS Register (address = 23h) [reset = 000Ch]
    25. 7.25 GPIO-CONFIG Register (address = 24h) [reset = 0000h]
    26. 7.26 DEVICE-MODE-CONFIG Register (address = 25h) [reset = 0000h]
    27. 7.27 INTERFACE-CONFIG Register (address = 26h) [reset = 0000h]
    28. 7.28 SRAM-CONFIG Register (address = 2Bh) [reset = 0000h]
    29. 7.29 SRAM-DATA Register (address = 2Ch) [reset = 0000h]
    30. 7.30 BRDCAST-DATA Register (address = 50h) [reset = 0000h]
  9. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 ドキュメントの更新通知を受け取る方法
    3. 9.3 サポート・リソース
    4. 9.4 Trademarks
    5. 9.5 静電気放電に関する注意事項
    6. 9.6 用語集
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Smart Analog Front End (AFE) Architecture

The voltage-output DAC channels of the AFEx32A3W devices consist of a string architecture with a voltage-output amplifier, as well as an external feedback pin on channel 1. Section 6.2 shows the DAC architecture within the block diagram that operates from a 3-V to 5.5-V power supply. The DAC has an internal voltage reference of 1.21 V. Optionally, use the power supply as a reference. The voltage-output mode supports multiple programmable output ranges.

The AFEx32A3W devices support Hi-Z output when VDD is off, maintaining very low leakage current at the output pins with up to 1.25 V of forced voltage. The DAC output pin also starts up in high-impedance mode by default, making these devices an excellent choice for voltage margining and scaling applications. To change the power-up mode to 10 kΩ-GND or 100 kΩ-GND, program the corresponding DAC-PDN-x field in the COMMON-CONFIG register and load these bits in the device NVM.

The AFEx32A3W devices support comparator mode on channel 1. The FB1 pin acts as an input for the comparator. The DAC architecture supports inversion of the comparator output using register settings. The comparator outputs can be push-pull or open-drain. The comparator mode supports programmable hysteresis using the margin-high and margin-low register fields, latching comparator, and window comparator. The comparator outputs are accessible internally by the device.

The AFEx32A3W supports an ADC input on channel 1. Pull the FB1 to VDD in this mode and use the VOUT1/AIN1 pin as the analog input. The channel must be configured as a comparator to enable the ADC mode. Channel 0 functions as a closed-loop buffered voltage-output DAC.

Channel 2 functions as a current source with a minimum 770-mV headroom at 300-mA output. Make sure the junction temperature of the device is kept within the recommended limit while using the current output.

The AFEx32A3W devices include a smart feature set to enable processor-less operation and high integration. The NVM enables a predictable start-up. In the absence of a processor or when the processor or software fails, the GPIO triggers the DAC output without the SPI or I2C interface. The integrated functions and the FB1 pin enable PWM output for control applications.