JAJSHN4D June   2019  – December 2021 BQ25618 , BQ25619

PRODUCTION DATA  

  1. Features
  2. アプリケーション
  3. Description
  4. Revision History
  5. Description (continued)
  6. Pin Configuration and Functions
  7. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Thermal Information
    6. 7.6 Electrical Characteristics
    7. 7.7 Timing Requirements
    8. 7.8 Typical Characteristics
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Power-On-Reset (POR)
      2. 8.3.2  Device Power Up From Battery Without Input Source
      3. 8.3.3  Power Up From Input Source
        1. 8.3.3.1 Power Up REGN LDO
        2. 8.3.3.2 Poor Source Qualification
        3. 8.3.3.3 Input Source Type Detection (IINDPM Threshold)
          1. 8.3.3.3.1 PSEL Pins Sets Input Current Limit
        4. 8.3.3.4 Input Voltage Limit Threshold Setting (VINDPM Threshold)
        5. 8.3.3.5 Power Up Converter in Buck Mode
        6. 8.3.3.6 HIZ Mode with Adapter Present
      4. 8.3.4  Boost Mode Operation From Battery
      5. 8.3.5  Power Path Management
        1. 8.3.5.1 Narrow VDC Architecture
        2. 8.3.5.2 Dynamic Power Management
        3. 8.3.5.3 Supplement Mode
      6. 8.3.6  Battery Charging Management
        1. 8.3.6.1 Autonomous Charging Cycle
        2. 8.3.6.2 Battery Charging Profile
        3. 8.3.6.3 Charging Termination
        4. 8.3.6.4 Thermistor Qualification
          1. 8.3.6.4.1 JEITA Guideline Compliance During Charging Mode
          2. 8.3.6.4.2 Boost Mode Thermistor Monitor During Battery Discharge Mode
        5. 8.3.6.5 Charging Safety Timer
      7. 8.3.7  Ship Mode and QON Pin
        1. 8.3.7.1 BATFET Disable (Enter Ship Mode)
        2. 8.3.7.2 BATFET Enable (Exit Ship Mode)
        3. 8.3.7.3 BATFET Full System Reset
      8. 8.3.8  Status Outputs (STAT, INT , PMID_GOOD)
        1. 8.3.8.1 Power Good Indicator (PG_STAT Bit)
        2. 8.3.8.2 Charging Status Indicator (STAT)
        3. 8.3.8.3 Interrupt to Host (INT)
        4. 8.3.8.4 PMID Voltage Indicator (PMID_GOOD)
      9. 8.3.9  Protections
        1. 8.3.9.1 Voltage and Current Monitoring in Buck Mode
          1. 8.3.9.1.1 Input Overvoltage Protection (ACOV)
          2. 8.3.9.1.2 System Overvoltage Protection (SYSOVP)
        2. 8.3.9.2 Voltage and Current Monitoring in Boost Mode
          1. 8.3.9.2.1 Boost Mode Overvoltage Protection
          2. 8.3.9.2.2 PMID Overcurrent Protection
        3. 8.3.9.3 Thermal Regulation and Thermal Shutdown
          1. 8.3.9.3.1 Thermal Protection in Buck Mode
          2. 8.3.9.3.2 Thermal Protection in Boost Mode
        4. 8.3.9.4 Battery Protection
          1. 8.3.9.4.1 Battery Overvoltage Protection (BATOVP)
          2. 8.3.9.4.2 Battery Overdischarge Protection
          3. 8.3.9.4.3 System Overcurrent Protection
      10. 8.3.10 Serial Interface
        1. 8.3.10.1 Data Validity
        2. 8.3.10.2 START and STOP Conditions
        3. 8.3.10.3 Byte Format
        4. 8.3.10.4 Acknowledge (ACK) and Not Acknowledge (NACK)
        5. 8.3.10.5 Slave Address and Data Direction Bit
        6. 8.3.10.6 Single Read and Write
        7. 8.3.10.7 Multi-Read and Multi-Write
    4. 8.4 Device Functional Modes
      1. 8.4.1 Host Mode and Default Mode
    5. 8.5 Register Maps
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Inductor Selection
        2. 9.2.2.2 Input Capacitor and Resistor
        3. 9.2.2.3 Output Capacitor
      3. 9.2.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Third-Party Products Disclaimer
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documentation
    3. 12.3 Receiving Notification of Documentation Updates
    4. 12.4 サポート・リソース
    5. 12.5 Trademarks
    6. 12.6 Electrostatic Discharge Caution
    7. 12.7 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Layout Guidelines

The switching node rise and fall times should be minimized for minimum switching loss. Proper layout of the components to minimize the high frequency current path loop (see Figure 11-1) is important to prevent electrical and magnetic field radiation and high frequency resonant problems. Follow this specific order carefully to achieve the proper layout.

  1. Place an input capacitor as close as possible to the PMID pin and GND pin connections and use the shortest copper trace connection or GND plane. Add a 1-nF small size (such as 0402 or 0201) decoupling cap for the high frequency noise filter and EMI improvement.
  2. Place the inductor input pin as close as possible to SW pin. Minimize the copper area of this trace to lower electrical and magnetic field radiation but make the trace wide enough to carry the charging current. Do not use multiple layers in parallel for this connection. Minimize parasitic capacitance from this area to any other trace or plane.
  3. Put the output capacitor near to the inductor and the device. Ground connections need to be tied to the IC ground with a short copper trace connection or GND plane.
  4. Route the analog ground separately from power ground. Connect the analog ground and connect power ground separately. Connect the analog ground and power ground together using the thermal pad as the single ground connection point. Or use a 0-Ω resistor to tie the analog ground to power ground.
  5. Use a single ground connection to tie the charger power ground to the charger analog ground just beneath the device. Use ground copper pour but avoid power pins to reduce inductive and capacitive noise coupling.
  6. Place the decoupling capacitors next to the IC pins and make the trace connection as short as possible.
  7. It is critical that the exposed thermal pad on the backside of the device package be soldered to the PCB ground. Ensure that there are sufficient thermal vias directly under the IC, connecting to the ground plane on the other layers.
  8. Ensure that the number and sizes of vias allow enough copper for a given current path.

See the BQ25618 BMS024 Evaluation Module User's Guide and BQ25619 BMS025 Evaluation Module EVM User's Guide for the recommended component placement with trace and via locations. For the VQFN information, refer to Quad Flatpack No-Lead Logic Packages Application Report and QFN and SON PCB Attachment Application Report.