JAJSSH0 December   2023 BQ77307

PRODUCTION DATA  

  1.   1
  2. 1 特長
  3. 2 アプリケーション
  4. 3 概要
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information BQ77307
    5. 6.5  Supply Current
    6. 6.6  Digital I/O
    7. 6.7  REGOUT LDO
    8. 6.8  Voltage References
    9. 6.9  Current Detector
    10. 6.10 Thermistor Pullup Resistor
    11. 6.11 Hardware Overtemperature Detector
    12. 6.12 Internal Oscillator
    13. 6.13 Charge and Discharge FET Drivers
    14. 6.14 Protection Subsystem
    15. 6.15 Timing Requirements - I2C Interface, 100kHz Mode
    16. 6.16 Timing Requirements - I2C Interface, 400kHz Mode
    17. 6.17 Timing Diagram
    18. 6.18 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Device Configuration
      1. 7.3.1 Commands and Subcommands
      2. 7.3.2 Configuration Using OTP or Registers
      3. 7.3.3 Device Security
    4. 7.4 Device Hardware Features
      1. 7.4.1  Voltage Protection Subsystem
      2. 7.4.2  Current Protection Subsystem
      3. 7.4.3  Unused VC Pins
      4. 7.4.4  Internal Temperature Protection
      5. 7.4.5  Thermistor Temperature Protections
      6. 7.4.6  Protection FET Drivers
      7. 7.4.7  Voltage References
      8. 7.4.8  Multiplexer
      9. 7.4.9  LDOs
      10. 7.4.10 Standalone Versus Host Interface
      11. 7.4.11 ALERT Pin Operation
      12. 7.4.12 Low Frequency Oscillator
      13. 7.4.13 I2C Serial Communications Interface
    5. 7.5 Protection Subsystem
      1. 7.5.1 Protections Overview
      2. 7.5.2 Primary Protections
      3. 7.5.3 Cell Open Wire Protection
      4. 7.5.4 Diagnostic Checks
    6. 7.6 Device Power Modes
      1. 7.6.1 Overview of Power Modes
      2. 7.6.2 NORMAL Mode
      3. 7.6.3 SHUTDOWN Mode
      4. 7.6.4 CONFIG_UPDATE Mode
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Performance Plot
      4. 8.2.4 Random Cell Connection Support
      5. 8.2.5 Startup Timing
      6. 8.2.6 FET Driver Turn-Off
      7. 8.2.7 Usage of Unused Pins
  10. 9 Power Supply Recommendations
  11. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 ドキュメントの更新通知を受け取る方法
    3. 11.3 サポート・リソース
    4. 11.4 Trademarks
    5. 11.5 静電気放電に関する注意事項
    6. 11.6 用語集
  13. 12Revision History
  14. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.5.3 Cell Open Wire Protection

The BQ77307 device supports detection of a broken connection between a cell in the pack and the cell attachment to the PCB containing the BQ77307 device. Without this check, the voltage at the cell input pin of the BQ77307 device may persist for some time on the board-level capacitor, leading to incorrect voltage readings. The Cell Open Wire detection in the BQ77307 device operates by enabling a small current source from each cell to VSS at programmable intervals. If a cell input pin is floating due to an open wire condition, this current discharges the capacitance, causing the voltage at the pin to slowly drop. This drop in voltage eventually triggers a protection fault on that particular cell and the cell above it.

The Cell Open Wire current will be enabled at a periodic interval set by configuration register. This provides programmability in the average current drawn from ≈10 pA to ≈10 µA, based on the typical current level of 55 µA. See the BQ77307 Technical Reference Manual for more details.

Note: The Cell Open Wire check can create a cell imbalance, so the settings should be selected appropriately.