4 Revision History
Changes from D Revision (July 2013) to E Revision
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Added Pin Configuration and Functions section, ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section Go
Changes from C Revision (January 2013) to D Revision
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Power-Down Sequence deleted: 1. De-assert EN to the deviceGo
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Power-Up Sequence deleted: 1. Assert RSTN and de-assert EN to the device.Go
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Power-Up Sequence deleted: 5. Assert EN a minimum of 10 µs after RSTN has been de-asserted. Go
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Deleted the EN time line from Figure 34Go
Changes from B Revision (October 2011) to C Revision
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Added text to RSTN description in PIN FUNCTIONSGo
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Added RSTN pin row to VIH in RECOMMENDED OPERATING CONDITIONSGo
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Added RSTN pin row to VIL in RECOMMENDED OPERATING CONDITIONSGo
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Added rows to Device power under normal operation in POWER DISSIPATION tableGo
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Changed in Table 1 13.9 to 113.9Go
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Deleted unnecessary tie dot in Block DiagramGo
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Changed Table 3Go
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Changed Figure 17Go
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Changed Figure 18Go
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Changed SN75DP130 Local I2C Control and Status RegistersGo
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Added DP130 POWER SEQUENCING sectionGo
Changes from A Revision (September 2011) to B Revision
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Deleted pins 37 an 43 from GND in the PIN FUNCTIONS tableGo
Changes from * Revision (April 2011) to A Revision
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Changed pin numbers in PIN FUNCTIONS table, VDDD_DREG and NCGo