SCLK052 February   2024 SN54SC6T06-SEP , SN54SC6T07-SEP , SN54SC6T14-SEP , SN54SC6T17-SEP

 

  1.   1
  2.   SN54SC6T07-SEP Single-Event Latch-Up (SEL) Radiation Report
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 SEL Results
    2. 5.2 Event Rate Calculations
  9. 6Summary
  10. 7References

Abstract

The purpose of this study is to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the SN54SC6T07-SEP, a radiation tolerant, hex open-drain buffer with integrated translation. Heavy-ions with an LETEFF of 43MeV-cm2 / mg were used to irradiate three production devices with a fluence of 1 × 107 ions / cm2. The results demonstrate that the SN54SC6T07-SEP is SEL-free up to LETEFF = 43MeV-cm2 / mg as 125°C.

The SN54SC6T07-SEP Single-Event Latch-Up (SEL) radiation report covers the SEL performance of all four devices listed below. The SN54SC6T07-SEP device covers all functional blocks and active die area of the other three devices, which is why the device was selected for single-event effect testing for this group of voltage translation devices.

  • SN54SC6T07-SEP
  • SN54SC6T06-SEP
  • SN54SC6T14-SEP
  • SN54SC6T17-SEP