SLLA305A May   2010  – September 2023 ESD441 , TPD12S015 , TPD12S015A , TPD12S016 , TPD12S520 , TPD12S521 , TPD13S523 , TPD1E05U06 , TPD1E10B06 , TPD1E10B09 , TPD1E6B06 , TPD1S414 , TPD1S514 , TPD2E001 , TPD2E001-Q1 , TPD2E009 , TPD2E1B06 , TPD2E2U06 , TPD2E2U06-Q1 , TPD2EUSB30 , TPD2EUSB30A , TPD2S017 , TPD3F303 , TPD3S014 , TPD3S044 , TPD4E001 , TPD4E001-Q1 , TPD4E004 , TPD4E02B04 , TPD4E05U06 , TPD4E05U06-Q1 , TPD4E101 , TPD4E1B06 , TPD4E1U06 , TPD4E6B06 , TPD4EUSB30 , TPD4S010 , TPD4S012 , TPD4S014 , TPD4S1394 , TPD4S214 , TPD5E003 , TPD5S115 , TPD5S116 , TPD6E001 , TPD6E004 , TPD6E05U06 , TPD6F002 , TPD6F002-Q1 , TPD6F003 , TPD7S019 , TPD8E003 , TPD8F003 , TPD8S009

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Device Summary
  6. 3Pin Configuration and Functions
  7. 4Specifications
    1. 4.1 Absolute Maximum Ratings
    2. 4.2 ESD Ratings - JEDEC
    3. 4.3 ESD Ratings - AEC
    4. 4.4 ESD Ratings - IEC
    5. 4.5 ESD Ratings - ISO
    6. 4.6 Recommended Operating Conditions
    7. 4.7 Thermal Information
    8. 4.8 Electrical Characteristics
      1. 4.8.1 Reverse Standoff Voltage (VRWM)
      2. 4.8.2 Breakdown Voltage (VBR)
      3. 4.8.3 Leakage Current (ILEAK)
      4. 4.8.4 Dynamic Resistance (RDYN)
      5. 4.8.5 Line Capacitance (CL)
      6. 4.8.6 Clamping Voltage (VCLAMP)
    9. 4.9 Typical Characteristics
      1. 4.9.1 TLP Plot
      2. 4.9.2 ± 8kV Clamped IEC Waveform
      3. 4.9.3 Capacitance vs. Bias Voltage
      4. 4.9.4 Leakage Current vs. Temperature
      5. 4.9.5 Capacitance vs. Temperature
      6. 4.9.6 Insertion Loss
  8. 5Summary
  9. 6References
  10. 7Revision History

Absolute Maximum Ratings

The absolute maximum ratings specify the stress levels that may cause permanent damage to the device if exceeded. Table 4-1 is an example of an absolute maximum ratings table. The ratings typically consist of the storage and ambient operating temperatures as well as the IEC 61000-4-5 power and current ratings and some devices include IEC 61000-4-4 EFT immunity ratings.

The IEC 61000-4-5 is a surge immunity test that evaluates a device's ability to survive surge events, which are large increases in current for a duration in the µs range. Outdoor operation, long cabling, frequent load changes, and many other situations have greater risks of exposure to surge events. An important parameter to consider when selecting a device is the IPP, the peak current a system takes during a surge event. This is because surge pulses contain significant amounts of energy and require more protection due to the length of a surge event.

The IEC 61000-4-4 EFT is specific to testing fast transient/burst immunity. Typically, the testing is required for networking systems, field cable transmissions, and other industrial applications. For more details on the specifics of IEC 61000-4-5 and IEC 61000-4-4 testing, refer to the application note IEC 61000-4-x Tests for TI's Protection Devices.

Table 4-1 Absolute Maximum Ratings Example
MIN MAX UNIT
PPP IEC 61000-4-5 Power (tp - 8/20 µs) 57 W
IPP IEC 61000-4-5 Current (tp - 8/20 µs) 6 A
EFT IEC 61000-4-4 EFT Protection ±80 A
TA Ambient Operating Temperature -55 150 °C
Tstg Storage temperature -65 155 °C