SPRACI7A October   2018  – March 2022 TMS320F280021 , TMS320F280021-Q1 , TMS320F280023 , TMS320F280023-Q1 , TMS320F280023C , TMS320F280025 , TMS320F280025-Q1 , TMS320F280025C , TMS320F280025C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F28P550SJ , TMS320F28P559SJ-Q1

 

  1.   Trademarks
  2. 1Introduction
    1. 1.1 Overview of Memory Test Requirements
    2. 1.2 Terms and Definitions
  3. 2System Challenges to Memory Validation
    1. 2.1 Memory Test Flow
    2. 2.2 SRAM test Algorithmic Coverage
    3. 2.3 ROM Test Algorithmic Coverage
  4. 3Summary
  5. 4References
  6.   A M-POST Working in F28004x
    1.     A.1 Enabling of Test
    2.     A.2 M-POST Duration
    3.     A.3 M-POST Result
    4.     A.4 Periodic Self-Test
  7.   Revision History

1.2 Terms and Definitions

Table 1-1 Acronyms Used in This Document
Term Definition
ATE Automated Test Equipment
CPU Central Processing Unit
DC Diagnostic Coverage
DCSM Dual Zone Code Security Module
FTTI Fault Tolerant Time Interval
MDP Memory Data Path (Path interfacing the PBIST controller and the memory)
MPOST Memory Power on Self-Test
NMI Non-Maskable Interrupt
OTP One-Time Programmable
PBIST Programmable Built In Self-Test (Programmable engine required for self-test)
ROM Read-Only Memory
SRAM Static Random Access Memory