SPRACI7A October   2018  – March 2022 TMS320F280021 , TMS320F280021-Q1 , TMS320F280023 , TMS320F280023-Q1 , TMS320F280023C , TMS320F280025 , TMS320F280025-Q1 , TMS320F280025C , TMS320F280025C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F28P550SJ , TMS320F28P559SJ-Q1

 

  1.   Trademarks
  2. 1Introduction
    1. 1.1 Overview of Memory Test Requirements
    2. 1.2 Terms and Definitions
  3. 2System Challenges to Memory Validation
    1. 2.1 Memory Test Flow
    2. 2.2 SRAM test Algorithmic Coverage
    3. 2.3 ROM Test Algorithmic Coverage
  4. 3Summary
  5. 4References
  6.   A M-POST Working in F28004x
    1.     A.1 Enabling of Test
    2.     A.2 M-POST Duration
    3.     A.3 M-POST Result
    4.     A.4 Periodic Self-Test
  7.   Revision History

3 Summary

C2000 PBIST provides another diagnostic safety mechanism to the customer that can be used to further enable functionally safe systems. It can be used as an efficient means to detect latent faults in the ROMs and SRAMs of C2000 devices at start-up.