Power-supply rejection ratio (PSRR) for the OPA4H014-SEP is specified as ±0.1 μV/V typical and ±0.5 μV/V minimum across the recommended operating temperature (T_A = –55°C to +125°C). Power-supply rejection ratio was measured at V_S = ±9 V, with test limits of ±0.37 μV/V for guardbanding purposes. One device sample, tested to 1 × 10¹³ n/cm², was found to have a post-irradiation PSRR value of –0.373 μV/V, in excess of the test limit but nonetheless within the actual data sheet specification.

Open-loop gain (A_OL) for the OPA4H014-SEP is specified as 126 dB (±0.5 μV/V) typical and 114 dB (±2 μV/V) maximum at T_A = 25°C and with R_L = 2 kΩ. Open-loop gain was measured at V_S = ±2.25 V, with test limits of ±1.8 μV/V for guardbanding purposes. One device sample, tested to 5 × 10¹² n/cm², was found to have a post-irradiation A_OL value of 2.411 μV/V for one channel, in excess of the data sheet specification. The A_OL of the other three channels remained within the data sheet specifications and test limits. Another device sample, tested to 1 × 10¹³ n/cm², was found to have a post-irradiation A_OL value of 2.483 μV/V for one channel and 2.357 μV/V for another, in excess of the data sheet specification. The A_OL of the other two channels of the sample remained within the data sheet specifications, with values of 1.292 μV/V and 1.951 μV/V. A_OL remained within the data sheet specifications and test limits for all devices when measured at V_S = ±9 V. Full data for all ATE tests performed are included in the report appendix.

Figure 4-3 Sample Open-Loop Gain NDD Graph