SCLK052 February   2024 SN54SC6T06-SEP , SN54SC6T07-SEP , SN54SC6T14-SEP , SN54SC6T17-SEP

 

  1.   1
  2.   SN54SC6T07-SEP Single-Event Latch-Up (SEL) Radiation Report
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 SEL Results
    2. 5.2 Event Rate Calculations
  9. 6Summary
  10. 7References

5.1 SEL Results

During SEL characterization, the device was heated using forced hot air, maintaining device temperature at 125°C. A FLIR (FLIR ONE Pro LT) thermal camera was used to validate die temperature to make sure that the device was accurately heated (see Figure 3-5). The species used for SEL testing was a Xenon (129Xe) ion at a linac energy of 25MeV / u with an angle-of-incidence of 0° for an LETEFF of 43MeV-cm2 / mg. A fluence of approximately 1 × 107 ions / cm2 were used for the runs.

The three devices were powered up and exposed to the heavy-ions using the maximum recommended supply voltage of 5.5V using a National Instruments PXI Chassis PXIe-1085. The run duration to achieve this fluence was approximately two minutes. As listed in Table 5-1, no SEL events were observed during the nine runs, indicating that the SN54SC6T07-SEP is SEL-free. Figure 5-1, Figure 5-2, and Figure 5-3 show the plot of current versus time for run numbers one, four, and seven, respectively.

Table 5-1 Summary of SN54SC6T07-SEP Test Conditions and Results
Run NumberUnit NumberDistance (mm)Temperature
(°C)		IonAngleFLUX
(ions × cm2 / mg)		Fluence
(number of ions)		LETEFF
(MeV × cm2/ mg)		Did a SEL event occur?
1170121Xe0°1.00E+051.00E+0743No
2170121Xe0°1.00E+051.00E+0743No
3170121Xe0°1.00E+051.00E+0743No
4270122Xe0°1.00E+051.00E+0743No
5270122Xe0°1.00E+051.00E+0743No
6270122Xe0°1.00E+051.00E+0743No
7370123Xe0°1.00E+051.00E+0743No
8370123Xe0°1.00E+051.00E+0743No
9370123Xe0°1.00E+051.00E+0743No
GUID-20240126-SS0I-ZR3X-1B2V-8F5XGVDWTPDH-low.jpgFigure 5-1 Current versus Time for Run Number 1 of the SN54SC6T07-SEP at T = 125°C
GUID-20240126-SS0I-QWKM-8RVB-CWWCJPKBX4GG-low.jpgFigure 5-2 Current versus Time for Run Number 4 of the SN54SC6T07-SEP at T = 125°C
GUID-20240126-SS0I-SFDW-QMJM-0NFX7W3DPR3Q-low.jpgFigure 5-3 Current versus Time for Run 7 of the SN54SC6T07-SEP at T = 125°C

No SEL events were observed, indicating that the SN54SC6T07-SEP is SEL-immune at LETEFF = 43MeV-cm2 / mg and T = 125°C. Using the MFTF method shown in Single-Event Effects (SEE) Confidence Interval Calculations, the upper-bound cross-section (using a 95% confidence level) is calculated as:

Equation 1. σSEL≤1.23×10-7cm2/device for LETEFF=43MeV·cm2/mg and T=125°C