SFFS509 august   2023 TCAL9539-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)

1 Overview

This document contains information for the TCAL9539-Q1 (WQFN RTW package) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

Figure 1-1 andFigure 1-2 show the device functional block diagrams for reference.

GUID-20220128-SS0I-HJFJ-8WJK-WD3552C3ZJKM-low.svg Figure 1-1 Functional Block Diagram
GUID-20230803-SS0I-ZNHM-RHBB-4TTHDJSLX5XL-low.svg Figure 1-2 Simplified Schematic of P00 to P17

The TCAL9539-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.