SNLA421 December   2022 DS320PR810 , SN75LVPE5412 , SN75LVPE5421

 

  1.   Abstract
  2.   Trademarks
  3. 1Introduction
    1. 1.1 Add-in-Card (AIC) Form Factor
  4. 2Compliance Tests
    1. 2.1 Workshop Test Results
    2. 2.2 Electrical Testing Results
  5. 3Electrical Performance
    1. 3.1 Effects of EQ Index on Time Domain Signal
    2. 3.2 Effects of EQ Index on the Eye Diagram
    3. 3.3 Effects of DC Gain on Time Domain Signal
    4. 3.4 Effects of DC Gain on the Eye Diagram
  6. 4Compliance Setting Fine Tuning
  7. 5Summary
  8. 6References

1 Introduction

PCI Express compliance and interoperability testing is offered by the PCI Special Interest Group (PCI-SIG). The Compliance Workshop Program offers standardized device electrical and system testing for PCI Express systems, peripherals, and components. The program provides component and system manufacturers the opportunity to test new Intellectual Property (IP) for electrical performance and compatibility with other PCI Express products. Texas Instruments uses the PCI-SIG workshops to perform standardized PCIe tests which ultimately lead to inclusion on the PCI-SIG Integrators List. Products referenced on the Integrators List meet PCIe requirements and will provide a robust solution. The PCI-SIG compliance program is made up of several mandatory test procedures as well as an interoperability program.

The goal of this application note is to review the process and provide an understanding of the PCI-SIG Compliance Program, especially in the way that compliance testing relates to linear redrivers.