SPNA249 june   2023 TMS570LC4357-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2SEE Mechanisms
  6. 3Test Device Information
  7. 4Irradiation Facility and Setup
  8. 5SEL Results
  9. 6Summary
  10.   References

5 SEL Results

During SEL characterization, the device was heated using forced hot air, maintaining the IC temperature at 125°C. The temperature was monitored by means of a K-type thermocouple attached as close to the IC as possible. The species used for the SEL testing was a silver (47Ag) ion with an angle-of-incidence of 0° for an LETeff = 48 MeV-cm2/mg. The kinetic energy in the vacuum for this ion is 1.634 GeV (15-MeV/amu line). A flux of approximately 105 ions/cm2-s and a fluence of approximately 107 ions/cm2 were used for {two} runs. The supply voltages are supplied externally at the recommended maximum voltage setting noted in Table 3-1. Run duration to achieve this fluence was approximately {2} minutes.

Table 5-1 TMS570LC4357-SEP SEL Conditions
#Runs Distance (mm) Temperature (°C) Ion Angle Flux (ions.cm2/mg) Fluence (#ions/cm2) LETeff (MeV.cm2/mg)
{2} 40 125 47Ag 0° 1.00E+05 1.00E+07 48

Figure 5-1 shows plots of the power supply current over time. No SEL events were observed for any of the runs.

Equation 1. {σSEL ≤ 3.67} × 10–7 cm2 for LETEFF = 48 MeV-cm2/mg and T = 125°C
GUID-20220622-SS0I-RX35-VNVR-0R1VQ27RFXJP-low.png Figure 5-1 TMS570LC4357-SEP SEL Plot of all Three Power Supplies, 47Ag With 0° Angle, LETeff = 48MeV
Supply Bias
VCCAD 5.25 V
VCCIO 3.6 V
VCC(core) 1.32 V

No significant increases in current consistent with a latch-up event were detected Pre and Post Beam.