SPNA249 june   2023 TMS570LC4357-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2SEE Mechanisms
  6. 3Test Device Information
  7. 4Irradiation Facility and Setup
  8. 5SEL Results
  9. 6Summary
  10.   References

3 Test Device Information

The TMS570LC4357-SEP is packaged in a 337-pin (GWT) BGA terminal grid array. Figure 3-1 shows the I/O-signal and Power-Supply definitions for the package, and Table 3-1 shows the power supply bias during the SEL heavy ion testing.

GUID-20220622-SS0I-MLWW-DDTC-RZ81CWLFV9SR-low.gif Figure 3-1 TMS570LC4357-SEP Pinout Diagram
Table 3-1 TMS570LC4357-SEP SEL Voltage Bias Table
Supply Bias
VCCAD 5.25 V
VCCIO 3.6 V
VCC (core) 1.32 V
VSS GND