bq297xx Cost-Effective Voltage and Current Protection Integrated Circuit for Single-Cell Li-Ion and Li-Polymer Batteries (Rev. D)
SLUSBU9D – March2014 – revisedMay 2016
UNLESS OTHERWISE NOTED, this document contains PRODUCTION DATA.
13 Device and Documentation Support
13.1 Related Links
Table 3. Related Links
|PARTS||PRODUCT FOLDER||SAMPLE & BUY||TECHNICAL DOCUMENTS||TOOLS & SOFTWARE||SUPPORT & COMMUNITY|
|bq2970||Click here||Click here||Click here||Click here||Click here|
|bq2971||Click here||Click here||Click here||Click here||Click here|
|bq2972||Click here||Click here||Click here||Click here||Click here|
|bq2973||Click here||Click here||Click here||Click here||Click here|
13.2 Community Resources
- TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
- Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support.
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
13.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
Copyright© 2016, Texas Instruments Incorporated. An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers.Submit Documentation Feedback