SN74LV374AT

ACTIVO

SN74LV374AT

Detalles del producto

Number of channels 8 Technology family LV-AT Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Input type TTL-Compatible CMOS Output type 3-State Clock frequency (max) (MHz) 70 IOL (max) (mA) 16 IOH (max) (mA) -16 Supply current (max) (µA) 50 Features Balanced outputs, High speed (tpd 10-50ns), Over-voltage tolerant inputs, Partial power down (Ioff) Operating temperature range (°C) -40 to 85 Rating Catalog
Number of channels 8 Technology family LV-AT Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Input type TTL-Compatible CMOS Output type 3-State Clock frequency (max) (MHz) 70 IOL (max) (mA) 16 IOH (max) (mA) -16 Supply current (max) (µA) 50 Features Balanced outputs, High speed (tpd 10-50ns), Over-voltage tolerant inputs, Partial power down (Ioff) Operating temperature range (°C) -40 to 85 Rating Catalog
SOIC (DW) 20 131.84 mm² 12.8 x 10.3 SOP (NS) 20 98.28 mm² 12.6 x 7.8 TSSOP (PW) 20 41.6 mm² 6.5 x 6.4
  • Inputs Are TTL-Voltage Compatible
  • 4.5-V to 5.5-V VCC Operation
  • Typical tpd of 4.9 ns at 5 V
  • Typical VOLP (Output Ground Bounce) <0.8 V
    at VCC = 5 V, TA = 25°C
  • Typical VOHV (Output VOH Undershoot) >2.3 V
    at VCC = 5 V, TA = 25°C
  • Support Mixed-Mode Voltage Operation on All Ports
  • Ioff Supports Partial-Power-Down Mode Operation
  • Latch-Up Performance Exceeds 250 mA Per JESD 17
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

  • Inputs Are TTL-Voltage Compatible
  • 4.5-V to 5.5-V VCC Operation
  • Typical tpd of 4.9 ns at 5 V
  • Typical VOLP (Output Ground Bounce) <0.8 V
    at VCC = 5 V, TA = 25°C
  • Typical VOHV (Output VOH Undershoot) >2.3 V
    at VCC = 5 V, TA = 25°C
  • Support Mixed-Mode Voltage Operation on All Ports
  • Ioff Supports Partial-Power-Down Mode Operation
  • Latch-Up Performance Exceeds 250 mA Per JESD 17
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

The SN74LV374AT is an octal edge-triggered D-type flip-flop. This device features 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. The device is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

On the positive transition of the clock (CLK) input, the Q outputs are set to the logic levels set up at the data (D) inputs.

A buffered output-enable (OE) input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and the increased drive provide the capability to drive bus lines without need for interface or pullup components.

OE does not affect internal operations of the latch. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

The SN74LV374AT is an octal edge-triggered D-type flip-flop. This device features 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. The device is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

On the positive transition of the clock (CLK) input, the Q outputs are set to the logic levels set up at the data (D) inputs.

A buffered output-enable (OE) input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and the increased drive provide the capability to drive bus lines without need for interface or pullup components.

OE does not affect internal operations of the latch. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

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Documentación técnica

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* Data sheet OCTAL EDGE TRIGGERED D-TYPE FLIP-FLOP WITH 3-STATE OUTPUTS datasheet 16 jun 2010
Application note Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 15 dic 2022

Diseño y desarrollo

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Placa de evaluación

14-24-LOGIC-EVM — Módulo de evaluación genérico de productos lógicos para encapsulados D, DB, DGV, DW, DYY, NS y PW de

El módulo de evaluación 14-24-LOGIC-EVM (EVM) está diseñado para admitir cualquier dispositivo lógico que esté en un encapsulado D, DW, DB, NS, PW, DYY o DGV de 14 a 24 pines.

Guía del usuario: PDF | HTML
Placa de evaluación

14-24-NL-LOGIC-EVM — Módulo de evaluación genérico de productos lógicos para encapsulados sin conductores de 14 a 24 pine

14-24-NL-LOGIC-EVM es un módulo de evaluación (EVM) flexible diseñado para admitir cualquier dispositivo lógico o de traducción que tenga un encapsulado BQA, BQB, RGY, RSV, RJW o RHL de 14 a 24 pines.

Guía del usuario: PDF | HTML
Paquete Pasadores Descargar
SOIC (DW) 20 Ver opciones
SOP (NS) 20 Ver opciones
TSSOP (PW) 20 Ver opciones

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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