Inicio Convertidores de datos Convertidores analógico-digitales (ADC) ADC de precisión
Inicio
Convertidores de datos
Convertidores analógico-digitales (ADC)
ADC de precisión

TLC2543-EP

ACTIVO

Convertidor analógico a digital (ADC) de 12 bits con control en serie y 11 entradas analógicas, prod

Haga su pedido ahora
Hoja de datos

TLC2543-EP

ACTIVO
Hoja de datos Haga su pedido ahora

Detalles del producto

Resolution (Bits) 12 Sample rate (max) (ksps) 66 Number of input channels 11 Interface type SPI Architecture SAR Input type Single-ended Multichannel configuration Multiplexed Rating HiRel Enhanced Product Reference mode External Input voltage range (max) (V) 5.5 Input voltage range (min) (V) 0 Operating temperature range (°C) -55 to 125 Power consumption (typ) (mW) 5 Analog supply (min) (V) 4.5 Analog supply voltage (max) (V) 5.5 Digital supply (min) (V) 4.5 Digital supply (max) (V) 5.5
Resolution (Bits) 12 Sample rate (max) (ksps) 66 Number of input channels 11 Interface type SPI Architecture SAR Input type Single-ended Multichannel configuration Multiplexed Rating HiRel Enhanced Product Reference mode External Input voltage range (max) (V) 5.5 Input voltage range (min) (V) 0 Operating temperature range (°C) -55 to 125 Power consumption (typ) (mW) 5 Analog supply (min) (V) 4.5 Analog supply voltage (max) (V) 5.5 Digital supply (min) (V) 4.5 Digital supply (max) (V) 5.5
SOIC (DW) 20 131.84 mm² 12.8 x 10.3 SSOP (DB) 20 56.16 mm² 7.2 x 7.8
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -40°C to 125°C (TLC2543Q) and -55°C to 125°C (TLC2543M)
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • 12-Bit-Resolution Analog-to-Digital Converter (ADC)
  • 10-µs Conversion Time Over Operating Temperature
  • 11 Analog Input Channels
  • Three Built-In Self-Test Modes
  • Inherent Sample-and-Hold Function
  • Linearity Error . . . ±1 LSB Max
  • On-Chip System Clock
  • End-of-Conversion (EOC) Output
  • Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference)
  • Programmable Most Significant Bit (MSB) or Least Significant Bit (LSB) First
  • Programmable Power Down
  • Programmable Output Data Length
  • CMOS Technology
  • Application Report Available(2)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

(2) Microcontroller Based Data Acquisition Using the TLC2543 12-bit Serial-Out ADC (SLAA012)
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -40°C to 125°C (TLC2543Q) and -55°C to 125°C (TLC2543M)
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • 12-Bit-Resolution Analog-to-Digital Converter (ADC)
  • 10-µs Conversion Time Over Operating Temperature
  • 11 Analog Input Channels
  • Three Built-In Self-Test Modes
  • Inherent Sample-and-Hold Function
  • Linearity Error . . . ±1 LSB Max
  • On-Chip System Clock
  • End-of-Conversion (EOC) Output
  • Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference)
  • Programmable Most Significant Bit (MSB) or Least Significant Bit (LSB) First
  • Programmable Power Down
  • Programmable Output Data Length
  • CMOS Technology
  • Application Report Available(2)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

(2) Microcontroller Based Data Acquisition Using the TLC2543 12-bit Serial-Out ADC (SLAA012)

The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host.

In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the device features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.

The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host.

In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the device features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.
open-in-new Buscar otro/a ADC de precisión
Descargar Ver vídeo con transcripción Video

Productos similares que pueden interesarle

open-in-new Comparar alternativas
Funcionalidad similar a la del dispositivo comparado
ADS1258-EP ACTIVO Convertidor analógico a digital (ADC) de 16 canales y 24 bits de calidad de producto mejorado Higher speed, higher channel count
ADS1278-EP ACTIVO ADC Delta Sigma de 24 bits de muestreo simultáneo, 144 kHz, octal de producto mejorado Higher resolution, higher speed, lower channel count, different architecture
ADS1278-SP ACTIVO ADC Delta-Sigma de muestreo simultáneo de 24 bits y 8 canales endurecido por radiación Higher resolution, higher speed, lower channel count, different architecture
ADS8686S ACTIVO ADC de doble muestreo simultáneo de 16 bits, 1 MSPS y 16 canales con extremo frontal analógico integ Higher resolution, higher speed, higher channel count, commercial grade

Documentación técnica

star =Principal documentación para este producto seleccionada por TI
No se encontraron resultados. Borre su búsqueda y vuelva a intentarlo.
Ver todo 6
Tipo Título Fecha
* Data sheet TLC2543-EP datasheet (Rev. A) 02 nov 2006
* VID TLC2543-EP VID V6203614 21 jun 2016
* Radiation & reliability report TLC2543MDBREP Reliability Report 16 feb 2016
* Radiation & reliability report TLC2543QDWREP Reliability Report 22 dic 2014
E-book Best of Baker's Best: Precision Data Converters -- SAR ADCs 21 may 2015
Application note Determining Minimum Acquisition Times for SAR ADCs, part 2 17 mar 2011

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Herramienta de cálculo

ANALOG-ENGINEER-CALC — Calculadora para ingenieros analógicos

The analog engineer’s calculator is designed to speed up many of the repetitive calculations that analog circuit design engineers use on a regular basis. This PC-based tool provides a graphical interface with a list of various common calculations ranging from setting operational-amplifier (...)
Ver opciones
Herramienta de simulación

PSPICE-FOR-TI — PSpice® para herramienta de diseño y simulación de TI

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
Solicitar
Herramienta de simulación

TINA-TI — Programa de simulación analógica basado en SPICE

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
Guía del usuario: PDF
Ver opciones
Paquete Pasadores Descargar
SOIC (DW) 20 Ver opciones
SSOP (DB) 20 Ver opciones
Se aplican los Términos y condiciones estándar de TI para los elementos de evaluación.

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

Foros de TI E2E™ con asistencia técnica de los ingenieros de TI

Ver todos los temas del foro en inglés

El contenido lo proporcionan “tal como está” TI y los colaboradores de la comunidad y no constituye especificaciones de TI. Consulte los términos de uso.

Si tiene preguntas sobre la calidad, el paquete o el pedido de productos de TI, consulte el soporte de TI. ​​​​​​​​​​​​​​

Videos