CD4021B-Q1
- Qualified for Automotive Applications
- Medium-Speed Operation: 12-MHz (Typ) Clock Rate at VDD – VSS = 10 V
- Fully Static Operation
- Eight Master-Slave Flip-Flops Plus Output Buffering and Control Gating
- 100% Tested for Quiescent Current at 20 V
- Maximum Input Current of 1 µA at 18 V Over Full Package-Temperature Range:
100 nA at 18 V and 25°C - Noise Margin (Full Package-Temperature Range):
- 1 V at VDD = 5 V
- 2 V at VDD = 10 V
- 2.5 V at VDD = 15 V
- Standardized Symmetrical Output Characteristics
- 5-V, 10-V, and 15-V Parametric Ratings
- Meets All Requirements of JEDEC Tentative Standard No. 13B,
"Standard Specifications for Description of ’B’ Series CMOS Devices" - Latch-Up Performance Meets 50 mA per JESD 78, Class I
- APPLICATIONS
- Parallel Input/Serial Output Data Queuing
- Parallel-to-Serial Data Conversion
- General-Purpose Register
CD4021B series types are 8-stage parallel- or serial-input/serial output registers having common CLOCK and PARALLEL/SERIAL CONTROL inputs, a single SERIAL data input, and individual parallel "JAM" inputs to each register stage. Each register stage is a D-type, master-slave flip-flop. In addition to an output from stage 8, "Q" outputs are also available from stages 6 and 7. Parallel as well as serial entry is made into the register synchronously with the positive clock line transition in the CD4014B. In the CD4021B serial entry is synchronous with the clock but parallel entry is asynchronous. In both types, entry is controlled by the PARALLEL/SERIAL CONTROL input. When the PARALLEL/SERIAL CONTROL input is low, data is serially shifted into the 8-stage register synchronously with the positive transition of the clock line. When the PARALLEL/SERIAL CONTROL input is high, data is jammed into the 8-stage register via the parallel input lines and synchronous with the positive transition of the clock line. In the CD4021B, the CLOCK input of the internal stage is "forced" when asynchronous parallel entry is made. Register expansion using multiple packages is permitted.
The CD4021B series types are supplied in 16-lead hermetic dual-in-line ceramic packages (D and F suffixes), 16-lead dual-in-line plastic packages (E suffix), and in chip form (H suffix).
기술 문서
| 유형 | 직함 | 날짜 | ||
|---|---|---|---|---|
| * | Data sheet | CD4021B-Q1 CMOS 8-Stage Static Shift Register datasheet | 2010/03/26 | |
| Application note | Power-Up Behavior of Clocked Devices (Rev. B) | PDF | HTML | 2022/12/15 | |
| Selection guide | Logic Guide (Rev. AB) | 2017/06/12 | ||
| Application note | Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) | 2015/12/02 | ||
| More literature | Automotive Logic Devices Brochure | 2014/08/27 | ||
| User guide | LOGIC Pocket Data Book (Rev. B) | 2007/01/16 | ||
| Application note | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 2004/07/08 | ||
| User guide | Signal Switch Data Book (Rev. A) | 2003/11/14 | ||
| Application note | Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics | 2001/12/03 |
설계 및 개발
추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.
14-24-LOGIC-EVM — 14핀~24핀 D, DB, DGV, DW, DYY, NS 및 PW 패키지용 로직 제품 일반 평가 모듈
14-24-LOGIC-EVM 평가 모듈(EVM)은 14핀~24핀 D, DW, DB, NS, PW, DYY 또는 DGV 패키지에 있는 모든 로직 장치를 지원하도록 설계되었습니다.
| 패키지 | 핀 | 다운로드 |
|---|---|---|
| SOIC (D) | 16 | 옵션 보기 |
주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치