CD54AC280
- Buffered Inputs
- Typical Propagation Delay
- 10ns at VCC = 5V, TA = 25°C, CL = 50pF - Exceeds 2kV ESD Protection per MIL-STD-883, Method 3015
- SCR-Latchup-Resistant CMOS Process and Circuit Design
- Speed of Bipolar FAST™/AS/S with Significantly Reduced Power Consumption
- Balanced Propagation Delays
- AC Types Feature 1.5V to 5.5V Operation and Balanced Noise Immunity at 30% of the Supply
- ±24mA Output Drive Current
- Fanout to 15 FAST™ ICs
- Drives 50
Transmission Lines - Characterized for operation from –40° to 85°C
FAST™ is a Trademark of Fairchild Semiconductor.
The ’AC280 and ’ACT280 are 9-bit odd/even parity generator/checkers that utilize Advanced CMOS Logic technology. Both even and odd parity outputs are available for checking or generating parity for words up to nine bits long. Even parity is indicated (
E output to any input of an additional ’AC280, ’ACT280 parity checker.
기술 문서
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모두 보기13 | 유형 | 직함 | 날짜 | ||
|---|---|---|---|---|
| * | Data sheet | 9-Bit Odd/Even Parity Generator/Checker datasheet (Rev. A) | 2000/05/17 | |
| Application note | Implications of Slow or Floating CMOS Inputs (Rev. E) | 2021/07/26 | ||
| Selection guide | Logic Guide (Rev. AB) | 2017/06/12 | ||
| Application note | Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) | 2015/12/02 | ||
| More literature | HiRel Unitrode Power Management Brochure | 2009/07/07 | ||
| User guide | LOGIC Pocket Data Book (Rev. B) | 2007/01/16 | ||
| Application note | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 2004/07/08 | ||
| Application note | TI IBIS File Creation, Validation, and Distribution Processes | 2002/08/29 | ||
| Application note | CMOS Power Consumption and CPD Calculation (Rev. B) | 1997/06/01 | ||
| Application note | Designing With Logic (Rev. C) | 1997/06/01 | ||
| Application note | Input and Output Characteristics of Digital Integrated Circuits | 1996/10/01 | ||
| Application note | Live Insertion | 1996/10/01 | ||
| Application note | Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc | 1996/04/01 |
설계 및 개발
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주문 및 품질
포함된 정보:
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
포함된 정보:
- 팹 위치
- 조립 위치