SN65HVD11-HT
- Operates With a 3.3-V Supply
- Bus-Pin ESD Protection Exceeds 16-kV Human-
Body Model (HBM) - 1/8 Unit-Load Option Available (up to 256 Nodes
on Bus) - Optional Driver Output Transition Times for
Signaling Rates(1) of 1 Mbps, 10 Mbps,
and 32 Mbps - Based on ANSI TIA/EIA-485-A
- Bus-Pin Short Circuit Protection From
–7 V to 12 V - Open-Circuit, Idle-Bus, and Shorted-Bus Fail-Safe
Receiver - Glitch-Free Power-Up and Power-Down Protection
for Hot-Plugging Applications - SN75176 Footprint
- Supports Extreme Temperature Applications:
- Controlled Baselines
- One Assembly and Test Sites
- One Fabrication Sites
- Available in Extreme (–55°C/210°C)
Temperature Range(2) - Extended Product Life Cycles
- Extended Product-Change Notifications
- Product Traceability
- Texas Instruments’ High Temperature
Products Use Highly Optimized Silicon (Die)
Solutions With Design and Process
Enhancements to Maximize Performance Over
Extended Temperatures.
The SN65HVD11-HT device combines a 3-state differential line driver and differential input line receiver that operates with a single 3.3-V power supply. It is designed for balanced transmission lines and meets or exceeds ANSI TIA/EIA-485-A and ISO 8482:1993, with the exception that the thermal shutdown is removed. This differential bus transceiver is a monolithic integrated circuit designed for bidirectional data communication on multipoint bus-transmission lines. The driver and receiver have active-high and active-low enables, respectively, that can be externally connected together to function as direction control.
The driver differential outputs and receiver differential inputs connect internally to form a differential input/ output (I/O) bus port that is designed to offer minimum loading to the bus when the driver is disabled or VCC = 0.
기술 문서
유형 | 직함 | 날짜 | ||
---|---|---|---|---|
* | Data sheet | SN65HVD11-HT 3.3-V RS-485 Transceiver datasheet (Rev. F) | PDF | HTML | 2015/11/30 |
* | Radiation & reliability report | SN65HVD11HKJ_HKQ Reliability Reports | 2012/09/20 | |
* | Radiation & reliability report | SN65HVD11JD Reliability Report | 2012/09/20 | |
* | Radiation & reliability report | SN65HVD11HD Reliability Report (Rev. A) | 2012/08/17 | |
EVM User's guide | Harsh Environment Acquisition Terminal (H.E.A.T.) System Evaluation Kit (Rev. D) | 2015/07/24 |
설계 및 개발
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패키지 | 핀 | 다운로드 |
---|---|---|
CDIP_SB (JDJ) | 8 | 옵션 보기 |
CFP (HKJ) | 8 | 옵션 보기 |
CFP (HKQ) | 8 | 옵션 보기 |
DIESALE (KGD) | — | |
SOIC (D) | 8 | 옵션 보기 |
주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치
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