TLV5633
- 12-Bit Voltage Output DAC
- Programmable Internal Reference
- Programmable Settling Time vs Power
Consumption- 1 µs in Fast Mode
- 3.5 µs in Slow Mode
- 8-Bit µController Compatible Interface
- Differential Nonlinearity. . .<0.5 LSB Typ
- Voltage Output Range. . .2x the Reference Voltage
- Monotonic Over Temperature
- APPLICATIONS
- Digital Servo Control Loops
- Digital Offset and Gain Adjustment
- Industrial Process Control
- Machine and Motion Control Devices
- Mass Storage Devices
MCS is a registered trademark of Intel Corporation .
The TLV5633 is a 12-bit voltage output digital- to-analog converter (DAC) with an 8-bit microcontroller compatible parallel interface. The 8 LSBs, the 4 MSBs, and 5 control bits are written using three different addresses. Developed for a wide range of supply voltages, the TLV5633 can be operated from 2.7 V to 5.5 V.
The resistor string output voltage is buffered by a x2 gain rail-to-rail output buffer. The buffer features a Class A (slow mode: AB) output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows the designer to optimize speed versus power dissipation. With its on-chip programmable precision voltage reference, the TLV5633 simplifies overall system design. Because of its ability to source up to 1 mA, the internal reference can also be used as a system reference. The settling time and the reference voltage can be chosen by a control register.
Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in 20-pin SOIC and TSSOP packages in standard commercial and industrial temperature ranges.
기술 자료
유형 | 직함 | 날짜 | ||
---|---|---|---|---|
* | Data sheet | 2.7 V to 5.5 V Low Power 12-Bit D/A Converters w/Internal Refer & Power Down datasheet (Rev. C) | 2006/09/28 |
설계 및 개발
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패키지 | 핀 | CAD 기호, 풋프린트 및 3D 모델 |
---|---|---|
SOIC (DW) | 20 | Ultra Librarian |
TSSOP (PW) | 20 | Ultra Librarian |
주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치