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數據轉換器
類比轉數位轉換器 (ADC)
高速 ADC (≥10 MSPS)

ADC12D1600QML-SP

現行

抗輻射保證 (RHA)、300-krad、陶瓷、12 位元、雙 1.6-GSPS 或單 3.2-GSPS ADC

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產品規格表

ADC12D1600QML-SP

現行
產品規格表 立即訂購

產品詳細資料

Sample rate (max) (Msps) 1600, 3200 Resolution (Bits) 12 Number of input channels 1, 2 Interface type Parallel LVDS Analog input BW (MHz) 2400 Features Ultra High Speed Rating Space Peak-to-peak input voltage range (V) 0.8 Power consumption (typ) (mW) 3880 Architecture Folding Interpolating SNR (dB) 58.2 ENOB (bit) 9.3 SFDR (dB) 67.3 Operating temperature range (°C) -55 to 125 Input buffer Yes Radiation, TID (typ) (krad) 300 Radiation, SEL (MeV·cm2/mg) 120
Sample rate (max) (Msps) 1600, 3200 Resolution (Bits) 12 Number of input channels 1, 2 Interface type Parallel LVDS Analog input BW (MHz) 2400 Features Ultra High Speed Rating Space Peak-to-peak input voltage range (V) 0.8 Power consumption (typ) (mW) 3880 Architecture Folding Interpolating SNR (dB) 58.2 ENOB (bit) 9.3 SFDR (dB) 67.3 Operating temperature range (°C) -55 to 125 Input buffer Yes Radiation, TID (typ) (krad) 300 Radiation, SEL (MeV·cm2/mg) 120
CCGA (NAA) 376 780.6436 mm² 27.94 x 27.94
  • Total Ionizing Dose (TID) to 300 krad(Si)
  • Single Event Latch-up (SEL) > 120 MeV-cm2/mg
  • Wide Temperature Range –55°C to +125°C
  • Low Power Consumption
  • R/W SPI for Extended Control Mode or Simple Pin Control Mode
  • Interleaved Timing Automatic with Manual Skew Adjust
  • Auto-Sync Function for Multi-Chip Systems
  • Time Stamp Feature to Capture External Trigger
  • Test Patterns at Output for System Debug
  • 1:1 Non-Demuxed or 1:2 or 1:4 Parallel Demuxed LVDS Outputs
  • Single 1.9V Power Supply
  • 376 CPGA Hermetic Package
  • Total Ionizing Dose (TID) to 300 krad(Si)
  • Single Event Latch-up (SEL) > 120 MeV-cm2/mg
  • Wide Temperature Range –55°C to +125°C
  • Low Power Consumption
  • R/W SPI for Extended Control Mode or Simple Pin Control Mode
  • Interleaved Timing Automatic with Manual Skew Adjust
  • Auto-Sync Function for Multi-Chip Systems
  • Time Stamp Feature to Capture External Trigger
  • Test Patterns at Output for System Debug
  • 1:1 Non-Demuxed or 1:2 or 1:4 Parallel Demuxed LVDS Outputs
  • Single 1.9V Power Supply
  • 376 CPGA Hermetic Package

The ADC12D1600QML is a low power, high performance CMOS analog-to-digital converter that digitizes signals at a 12-bit resolution at sampling rates up to 3.2 GSPS in an interleaved mode. It can also be used as a dual channel ADC for sampling rates up to 1.6 GSPS. For sampling rates below 800 MHz, there is a Low Sampling Power Saving Mode (LSPSM) that reduces power consumption to less than 1.4 W per channel (typical). The ADC can support conversion rates as low as 200 MSPS.

The ADC1600QML provides a flexible parallel LVDS interface which has multiple SPI programmable options to facilitate board design and ASIC/FPGA data capture. The LVDS outputs are compatible with IEEE 1596.3-1996 and support programmable common mode voltage. The output of each channel is configurable in either 1:1 non-demuxed or 1:2 demuxed modes. If used as a single channel ADC, there is an option for 1:4 demuxing of the output. The product comes in a hermetic 376 CPGA package for harsh environments.

The ADC12D1600QML is a low power, high performance CMOS analog-to-digital converter that digitizes signals at a 12-bit resolution at sampling rates up to 3.2 GSPS in an interleaved mode. It can also be used as a dual channel ADC for sampling rates up to 1.6 GSPS. For sampling rates below 800 MHz, there is a Low Sampling Power Saving Mode (LSPSM) that reduces power consumption to less than 1.4 W per channel (typical). The ADC can support conversion rates as low as 200 MSPS.

The ADC1600QML provides a flexible parallel LVDS interface which has multiple SPI programmable options to facilitate board design and ASIC/FPGA data capture. The LVDS outputs are compatible with IEEE 1596.3-1996 and support programmable common mode voltage. The output of each channel is configurable in either 1:1 non-demuxed or 1:2 demuxed modes. If used as a single channel ADC, there is an option for 1:4 demuxing of the output. The product comes in a hermetic 376 CPGA package for harsh environments.
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類型 標題 日期
* Data sheet ADC12D1600QML 12-Bit, 3.2/2.0 GSPS RF Sampling ADC datasheet 2012年 12月 17日
* Radiation & reliability report ADC12D1600QML-SP/ADC12D1620QML-SP Single-Event Effects (SEE) Radiation Report 2020年 7月 27日
* Radiation & reliability report ADC12D1600CCMLS TID Report 2013年 1月 17日
* Radiation & reliability report Analysis of Low Dose Rate Effects on Parasitic Bipolar Structures in CMOS Proces 2012年 5月 4日
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) 2023年 8月 31日
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) PDF | HTML 2022年 11月 17日
Application note Single-Event Effects Confidence Interval Calculations (Rev. A) PDF | HTML 2022年 10月 19日
Selection guide TI Space Products (Rev. I) 2022年 3月 3日
Application brief Understanding Op Amp Noise in Audio Circuits PDF | HTML 2021年 6月 14日
Application note AN-2132 Synchronizing Multiple GSPS ADCs in a System: The AutoSync Feature (Rev. G) 2017年 2月 3日
Application note Wide Bandwidth Receiver Implementation by Interleaving Two Giga-Sampling ADCs 2015年 12月 7日
Application note Signal Chain Noise Figure Analysis 2014年 10月 29日
Application note Synchronizing the Giga-Sample ADCs Interfaced with Multiple FPGAs 2014年 8月 6日
Application note AN-2128 ADC1xD1x00 Pin Compatibility (Rev. C) 2013年 5月 1日
Application note From Sample Instant to Data Output: Understanding Latency in the GSPS ADC 2012年 12月 18日
Product overview ADC12Dxx00RF Direct RF-Sampling ADC Family 2012年 5月 16日

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模擬型號

ADC12D1600 IBIS Model (Rev. A)

SNAM125A.ZIP (43 KB) - IBIS Model
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PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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