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邏輯和電壓轉換
電壓轉換器及電平移位器
固定方向電壓轉換器

CD4504B-EP

現行

用於 TTL 到 CMOS 或 CMOS 到 CMOS 運作的 CMOS 六路電壓電平移位器

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產品規格表

CD4504B-EP

現行
產品規格表 立即訂購

產品詳細資料

Technology family CD4000 Bits (#) 6 Configuration 6 Ch A to B 0 Ch B to A High input voltage (min) (V) 2 High input voltage (max) (V) 18 Vout (min) (V) 15538 Vout (max) (V) 18 Data rate (max) (Mbps) 24 IOH (max) (mA) -6.8 IOL (max) (mA) -6.8 Supply current (max) (µA) 18 Features 22 Input type Standard CMOS Output type Balanced CMOS, Push-Pull Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family CD4000 Bits (#) 6 Configuration 6 Ch A to B 0 Ch B to A High input voltage (min) (V) 2 High input voltage (max) (V) 18 Vout (min) (V) 15538 Vout (max) (V) 18 Data rate (max) (Mbps) 24 IOH (max) (mA) -6.8 IOL (max) (mA) -6.8 Supply current (max) (µA) 18 Features 22 Input type Standard CMOS Output type Balanced CMOS, Push-Pull Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
TSSOP (PW) 16 32 mm² 5 x 6.4
  • Independence of Power-Supply Sequence Considerations – VCC Can Exceed VDD;
    Input Signals Can Exceed Both VCC and VDD
  • Up and Down Level-Shifting Capability
  • Shiftable Input Threshold for Either CMOS or TTL Compatibility
  • Standardized Symmetrical Output Characteristics
  • 100% Tested for Quiescent Current at 20 V
  • Maximum Input Current of 1 µA at 18 V Over Full Package-Temperature Range:
    100 nA at 18 V and 25°C
  • 5 V, 10 V, and 15 V Parametric Ratings
  • Meets All Requirements of JEDEC Standard No. 13B,
    "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • SUPPORTS DEFENSE, AEROSPACE, AND MEDICAL APPLICATIONS
    • Controlled Baseline
    • One Assembly/Test Site
    • One Fabrication Site
    • Available in Military (–55°C/125°C) Temperature Range(1)
    • Extended Product Life Cycle
    • Extended Product-Change Notification
    • Product Traceability

(1) Additional temperature ranges are available – contact factory
  • Independence of Power-Supply Sequence Considerations – VCC Can Exceed VDD;
    Input Signals Can Exceed Both VCC and VDD
  • Up and Down Level-Shifting Capability
  • Shiftable Input Threshold for Either CMOS or TTL Compatibility
  • Standardized Symmetrical Output Characteristics
  • 100% Tested for Quiescent Current at 20 V
  • Maximum Input Current of 1 µA at 18 V Over Full Package-Temperature Range:
    100 nA at 18 V and 25°C
  • 5 V, 10 V, and 15 V Parametric Ratings
  • Meets All Requirements of JEDEC Standard No. 13B,
    "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • SUPPORTS DEFENSE, AEROSPACE, AND MEDICAL APPLICATIONS
    • Controlled Baseline
    • One Assembly/Test Site
    • One Fabrication Site
    • Available in Military (–55°C/125°C) Temperature Range(1)
    • Extended Product Life Cycle
    • Extended Product-Change Notification
    • Product Traceability

(1) Additional temperature ranges are available – contact factory

CD4504B hex voltage level-shifter consists of six circuits which shift input signals from the VCC logic level to the VDD logic level. To shift TTL signals to CMOS logic levels, the SELECT input is at the VCC HIGH logic state. When the SELECT input is at a LOW logic state, each circuit translates signals from one CMOS level to another.

CD4504B hex voltage level-shifter consists of six circuits which shift input signals from the VCC logic level to the VDD logic level. To shift TTL signals to CMOS logic levels, the SELECT input is at the VCC HIGH logic state. When the SELECT input is at a LOW logic state, each circuit translates signals from one CMOS level to another.
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類型 標題 日期
* Data sheet CMOS Hex Voltage-Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation datasheet 2008年 9月 3日
* VID CD4504B-EP VID V6209606 2016年 6月 21日
* Radiation & reliability report CD4504BMPWREP Reliability Report 2012年 9月 12日
Selection guide Voltage Translation Buying Guide (Rev. A) 2021年 4月 15日
Selection guide Logic Guide (Rev. AB) 2017年 6月 12日
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
User guide LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
User guide Signal Switch Data Book (Rev. A) 2003年 11月 14日
Application note Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 2001年 12月 3日

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