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LM211-EP

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產品規格表

LM211-EP

現行
產品規格表 立即訂購

產品詳細資料

Number of channels 1 Output type Open-collector, Open-drain Propagation delay time (µs) 0.115 Vs (max) (V) 30 Vs (min) (V) 3.5 Vos (offset voltage at 25°C) (max) (mV) 3 Iq per channel (typ) (mA) 5.1 Input bias current (±) (max) (nA) 100 Rail-to-rail No Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125 Features Strobe, Vos Adj Pin VICR (max) (V) 28 VICR (min) (V) 0.5
Number of channels 1 Output type Open-collector, Open-drain Propagation delay time (µs) 0.115 Vs (max) (V) 30 Vs (min) (V) 3.5 Vos (offset voltage at 25°C) (max) (mV) 3 Iq per channel (typ) (mA) 5.1 Input bias current (±) (max) (nA) 100 Rail-to-rail No Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125 Features Strobe, Vos Adj Pin VICR (max) (V) 28 VICR (min) (V) 0.5
SOIC (D) 8 29.4 mm² 4.9 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • Fast Response Times
  • Strobe Capability
  • Maximum Input Bias Current . . . 300 nA
  • Maximum Input Offset Current . . . 70 nA
  • Can Operate From Single 5-V Supply

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • Fast Response Times
  • Strobe Capability
  • Maximum Input Bias Current . . . 300 nA
  • Maximum Input Offset Current . . . 70 nA
  • Can Operate From Single 5-V Supply

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The LM211-EP is a single high-speed voltage comparator. This device is designed to operate from a wide range of power-supply voltages, including ±15-V supplies for operational amplifiers and 5-V supplies for logic systems. The output levels are compatible with most TTL and MOS circuits. This comparator is capable of driving lamps or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system ground. The outputs can drive loads referenced to ground, VCC+ or VCC-. Offset balancing and strobe capabilities are available, and the outputs can be wired-OR connected. If the strobe is low, the output is in the off state, regardless of the differential input.

The LM211-EP is a single high-speed voltage comparator. This device is designed to operate from a wide range of power-supply voltages, including ±15-V supplies for operational amplifiers and 5-V supplies for logic systems. The output levels are compatible with most TTL and MOS circuits. This comparator is capable of driving lamps or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system ground. The outputs can drive loads referenced to ground, VCC+ or VCC-. Offset balancing and strobe capabilities are available, and the outputs can be wired-OR connected. If the strobe is low, the output is in the off state, regardless of the differential input.
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類型 標題 日期
* Data sheet LM211-EP datasheet (Rev. A) 2006年 2月 22日
* VID LM211-EP VID V6203638 2016年 6月 21日
* Radiation & reliability report LM211MDREP Reliability Report 2012年 5月 7日
E-book The Signal e-book: A compendium of blog posts on op amp design topics 2017年 3月 28日

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PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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