SNOSBI1C November   2009  – June 2015

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Operating Ratings
    6. 6.6 Electrical Characteristics
    7. 6.7 AC Electrical Characteristics
    8. 6.8 Typical Characteristics
  7. 7 Parameter Measurement Information
    1. 7.1 Tri-State Test Circuits and Waveforms
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Understanding ADC Error Specs
      2. 8.3.2 Digital Control Inputs
    4. 8.4 Device Functional Modes
      1. 8.4.1 Analog Input Modes
        1. 8.4.1.1 Normal Mode
        2. 8.4.1.2 Fault Mode
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Testing the ADC Converter
      2. 9.1.2 Microprocessor Interfacing
        1. 9.1.2.1 Interfacing 8080 Microprocessor Derivatives (8048, 8085)
        2. 9.1.2.2 Sample 8080A CPU Interfacing Circuitry and Program
        3. 9.1.2.3 INS8048 Interface
        4. 9.1.2.4 Interfacing the Z-80
        5. 9.1.2.5 Interfacing 6800 Microprocessor Derivatives (6502, etc.)
    2. 9.2 Typical Applications
      1. 9.2.1 8080 Interface
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
          1. 9.2.1.2.1 Analog Differential Voltage Inputs and Common-Mode Rejection
          2. 9.2.1.2.2 Analog Inputs — Input Current
            1. 9.2.1.2.2.1 Input Bypass Capacitors
            2. 9.2.1.2.2.2 Input Source Resistance
            3. 9.2.1.2.2.3 Noise
          3. 9.2.1.2.3 Reference Voltage
            1. 9.2.1.2.3.1 Span Adjust
            2. 9.2.1.2.3.2 Reference Accuracy Requirements
          4. 9.2.1.2.4 Errors and Reference Voltage Adjustments
            1. 9.2.1.2.4.1 Zero Error
            2. 9.2.1.2.4.2 Full-Scale
            3. 9.2.1.2.4.3 Adjusting for an Arbitrary Analog Input Voltage Range
          5. 9.2.1.2.5 Clocking Option
          6. 9.2.1.2.6 Restart During a Conversion
          7. 9.2.1.2.7 Continuous Conversions
          8. 9.2.1.2.8 Driving the Data Bus
          9. 9.2.1.2.9 Wiring and Hook-Up Precautions
      2. 9.2.2 Multiple ADC0801 Series to MC6800 CPU Interface
      3. 9.2.3 Auto-Zeroed Differential Transducer Amplifier and ADC Converter
      4. 9.2.4 Multiple ADC Converters in a Z-80 Interrupt Driven Mode
    3. 9.3 System Examples
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
  12. 12Device and Documentation Support
    1. 12.1 Related Links
    2. 12.2 Community Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

10 Power Supply Recommendations

Precautions should be taken to insure that the power supply for the integrated circuit never becomes reversed in polarity or that the unit is not inadvertently installed backwards in a test socket as an unlimited current surge through the resulting forward diode within the device could cause fusing of the internal conductors and result in a destroyed unit.

Noise spikes on the VCC supply line can cause conversion errors as the comparator will respond to this noise. A low-inductance, low-ESR tantalum bypass capacitor should be used close to the converter VCC pin, and a 10-µF is recommended. If an unregulated voltage is available in the system, a separate 5-V voltage regulator for the converter (and other analog circuitry) will greatly reduce digital noise on the VCC supply.